Patents Assigned to PROTRUSTECH CO., LTD
  • Publication number: 20240060901
    Abstract: A signal enhancement structure configured to enhance a signal of a specimen is provided. The signal enhancement structure includes a plurality of nanowires stacked in a first direction, a second direction, and a third direction. The nanowires are extended along at least two directions. A particle of the specimen is on the nanowires or in a gap among the nanowires. A manufacturing method of a signal enhancement structure and a measuring method with signal enhancement are also provided.
    Type: Application
    Filed: October 30, 2023
    Publication date: February 22, 2024
    Applicants: National Chung Hsing University, PROTRUSTECH CO., LTD
    Inventors: Chien-Chung Chang, Chun-Ta Huang
  • Patent number: 11340114
    Abstract: A spectrum measurement system includes a laser light source system, an optical signal receiving system and a beam splitting system. The laser light source system is configured to emit a laser output light beam to the object. The laser output light beam includes at least one of a first and a second peak-wavelength laser. After the object is radiated by the laser output light beam, the object generates a conversion beam. The conversion beam includes at least one of a first and a second spectral signals. The optical signal receiving system includes at least a first and a second signal receivers being respectively configured to receive the first and the second spectral signals. The beam splitting system provides a plurality of light exiting paths being configured to respectively transmit the first and the second spectral signals to the first and the second signal receivers.
    Type: Grant
    Filed: May 21, 2020
    Date of Patent: May 24, 2022
    Assignee: PROTRUSTECH CO., LTD
    Inventors: Chun-Ta Huang, Wei-Hsin Wang, Chien-Chung Chang
  • Publication number: 20220003681
    Abstract: A signal enhancement structure configured to enhance a signal of a specimen is provided. The signal enhancement structure includes a plurality of nanowires stacked in a first direction, a second direction, and a third direction. The nanowires are extended along at least two directions. A particle of the specimen is on the nanowires or in a gap among the nanowires. A manufacturing method of a signal enhancement structure is also provided.
    Type: Application
    Filed: July 2, 2021
    Publication date: January 6, 2022
    Applicants: National Chung Hsing University, PROTRUSTECH CO., LTD
    Inventors: Chien-Chung Chang, Chun-Ta Huang
  • Publication number: 20200370962
    Abstract: A spectrum measurement system includes a laser light source system, an optical signal receiving system and a beam splitting system. The laser light source system is configured to emit a laser output light beam to the object. The laser output light beam includes at least one of a first and a second peak-wavelength laser. After the object is radiated by the laser output light beam, the object generates a conversion beam. The conversion beam includes at least one of a first and a second spectral signals. The optical signal receiving system includes at least a first and a second signal receivers being respectively configured to receive the first and the second spectral signals. The beam splitting system provides a plurality of light exiting paths being configured to respectively transmit the first and the second spectral signals to the first and the second signal receivers.
    Type: Application
    Filed: May 21, 2020
    Publication date: November 26, 2020
    Applicant: PROTRUSTECH CO., LTD
    Inventors: Chun-Ta Huang, Wei-Hsin Wang, Chien-Chung Chang
  • Patent number: 10247674
    Abstract: An integrated Raman spectrum measurement system and a modularized laser module are provided. The modularized laser module includes a laser emitter and an axis adjustment mechanism. The laser emitter is configured to emit a laser beam. The axis adjustment mechanism is connected to the laser emitter and configured to adjust at least two parameters of axis and orientation of the laser emitter. A beam splitter is disposed on the path of the laser beam. A signal collection unit is for collecting at least a part of a signal light from the beam splitter, wherein the signal light is converting by an object after receiving the part of the laser beam.
    Type: Grant
    Filed: September 11, 2017
    Date of Patent: April 2, 2019
    Assignee: PROTRUSTECH CO., LTD
    Inventors: Chun-Ta Huang, Hsiu-Feng Tung, Wei-Hsin Wang
  • Publication number: 20170370850
    Abstract: An integrated Raman spectrum measurement system and a modularized laser module are provided. The modularized laser module includes a laser emitter and an axis adjustment mechanism. The laser emitter is configured to emit a laser beam. The axis adjustment mechanism is connected to the laser emitter and configured to adjust at least two parameters of axis and orientation of the laser emitter. A beam splitter is disposed on the path of the laser beam. A signal collection unit is for collecting at least a part of a signal light from the beam splitter, wherein the signal light is converting by an object after receiving the part of the laser beam.
    Type: Application
    Filed: September 11, 2017
    Publication date: December 28, 2017
    Applicant: PROTRUSTECH CO., LTD
    Inventors: Chun-Ta Huang, Hsiu-Feng Tung, Wei-Hsin Wang