Patents Assigned to PROTRUSTECH CO., LTD
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Publication number: 20240060901Abstract: A signal enhancement structure configured to enhance a signal of a specimen is provided. The signal enhancement structure includes a plurality of nanowires stacked in a first direction, a second direction, and a third direction. The nanowires are extended along at least two directions. A particle of the specimen is on the nanowires or in a gap among the nanowires. A manufacturing method of a signal enhancement structure and a measuring method with signal enhancement are also provided.Type: ApplicationFiled: October 30, 2023Publication date: February 22, 2024Applicants: National Chung Hsing University, PROTRUSTECH CO., LTDInventors: Chien-Chung Chang, Chun-Ta Huang
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Patent number: 11340114Abstract: A spectrum measurement system includes a laser light source system, an optical signal receiving system and a beam splitting system. The laser light source system is configured to emit a laser output light beam to the object. The laser output light beam includes at least one of a first and a second peak-wavelength laser. After the object is radiated by the laser output light beam, the object generates a conversion beam. The conversion beam includes at least one of a first and a second spectral signals. The optical signal receiving system includes at least a first and a second signal receivers being respectively configured to receive the first and the second spectral signals. The beam splitting system provides a plurality of light exiting paths being configured to respectively transmit the first and the second spectral signals to the first and the second signal receivers.Type: GrantFiled: May 21, 2020Date of Patent: May 24, 2022Assignee: PROTRUSTECH CO., LTDInventors: Chun-Ta Huang, Wei-Hsin Wang, Chien-Chung Chang
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Publication number: 20220003681Abstract: A signal enhancement structure configured to enhance a signal of a specimen is provided. The signal enhancement structure includes a plurality of nanowires stacked in a first direction, a second direction, and a third direction. The nanowires are extended along at least two directions. A particle of the specimen is on the nanowires or in a gap among the nanowires. A manufacturing method of a signal enhancement structure is also provided.Type: ApplicationFiled: July 2, 2021Publication date: January 6, 2022Applicants: National Chung Hsing University, PROTRUSTECH CO., LTDInventors: Chien-Chung Chang, Chun-Ta Huang
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Publication number: 20200370962Abstract: A spectrum measurement system includes a laser light source system, an optical signal receiving system and a beam splitting system. The laser light source system is configured to emit a laser output light beam to the object. The laser output light beam includes at least one of a first and a second peak-wavelength laser. After the object is radiated by the laser output light beam, the object generates a conversion beam. The conversion beam includes at least one of a first and a second spectral signals. The optical signal receiving system includes at least a first and a second signal receivers being respectively configured to receive the first and the second spectral signals. The beam splitting system provides a plurality of light exiting paths being configured to respectively transmit the first and the second spectral signals to the first and the second signal receivers.Type: ApplicationFiled: May 21, 2020Publication date: November 26, 2020Applicant: PROTRUSTECH CO., LTDInventors: Chun-Ta Huang, Wei-Hsin Wang, Chien-Chung Chang
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Patent number: 10247674Abstract: An integrated Raman spectrum measurement system and a modularized laser module are provided. The modularized laser module includes a laser emitter and an axis adjustment mechanism. The laser emitter is configured to emit a laser beam. The axis adjustment mechanism is connected to the laser emitter and configured to adjust at least two parameters of axis and orientation of the laser emitter. A beam splitter is disposed on the path of the laser beam. A signal collection unit is for collecting at least a part of a signal light from the beam splitter, wherein the signal light is converting by an object after receiving the part of the laser beam.Type: GrantFiled: September 11, 2017Date of Patent: April 2, 2019Assignee: PROTRUSTECH CO., LTDInventors: Chun-Ta Huang, Hsiu-Feng Tung, Wei-Hsin Wang
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Publication number: 20170370850Abstract: An integrated Raman spectrum measurement system and a modularized laser module are provided. The modularized laser module includes a laser emitter and an axis adjustment mechanism. The laser emitter is configured to emit a laser beam. The axis adjustment mechanism is connected to the laser emitter and configured to adjust at least two parameters of axis and orientation of the laser emitter. A beam splitter is disposed on the path of the laser beam. A signal collection unit is for collecting at least a part of a signal light from the beam splitter, wherein the signal light is converting by an object after receiving the part of the laser beam.Type: ApplicationFiled: September 11, 2017Publication date: December 28, 2017Applicant: PROTRUSTECH CO., LTDInventors: Chun-Ta Huang, Hsiu-Feng Tung, Wei-Hsin Wang