Patents Assigned to PSC ENGINEERING S.R.L.
  • Patent number: 10946941
    Abstract: A process is described for controlling the roll motion of a ship, with null or low ship speed, through at least one stabilizing fin. The process comprises the following steps: starting the movement of the stabilizing fin when the roll motion starts; impressing a motion law of the stabilizing fin depending on the roll rate; and ending the movement of the stabilizing fin when the roll motion ends.
    Type: Grant
    Filed: August 30, 2017
    Date of Patent: March 16, 2021
    Assignee: PSC Engineering S.R.L.
    Inventor: Santino Crupi
  • Patent number: 9267814
    Abstract: A system (1) is described for determining offsets (?) of measuring instruments, in particular of measures with a null or constant mean value, composed of first processing means (3) adapted to compute, from at least one value of a measuring signal (S) deriving from an instantaneous measure performed by at least one measuring instrument or a sensor, at least one offset value (?) of such signal (S); and second processing means (5) adapted to subtract such offset value (?) from the value of the instantaneous measure signal (S) to obtain a corrected measure value (S??) of such signal S. A process is also described for determining offsets (?) of measuring instruments, in particular of measures with a null or constant mean value.
    Type: Grant
    Filed: September 13, 2011
    Date of Patent: February 23, 2016
    Assignee: PSC ENGINEERING S.R.L.
    Inventor: Santino Crupi
  • Publication number: 20130179106
    Abstract: A system (1) is described for determining offsets (?) of measuring instruments, in particular of measures with a null or constant mean value, composed of first processing means (3) adapted to compute, from at least one value of a measuring signal (S) deriving from an instantaneous measure performed by at least one measuring instrument or a sensor, at least one offset value (?) of such signal (S); and second processing means (5) adapted to subtract such offset value (?) from the value of the instantaneous measure signal (S) to obtain a corrected measure value (S??) of such signal S. A process is also described for determining offsets (?) of measuring instruments, in particular of measures with a null or constant mean value.
    Type: Application
    Filed: September 13, 2011
    Publication date: July 11, 2013
    Applicant: PSC ENGINEERING S.R.L.
    Inventor: Santino Crupi