Patents Assigned to PureSphere Co., Ltd.
  • Patent number: 11738299
    Abstract: An exhaust gas processing system including a process chamber in which an exhaust gas is produced; an exhaust gas measurer receiving the exhaust gas and measuring a concentration of the exhaust gas; a solid producing gas processor receiving the exhaust gas and removing a solid producing gas contained in the exhaust gas; a gas supply supplying dilution and cooling gases to the solid producing gas processor; a processed gas measurer receiving, as a processed gas, the exhaust gas free of the solid producing gas and measuring a temperature of the processed gas and ingredients of the processed gas; and a controller receiving results of measurement of the concentration of the exhaust gas from the exhaust gas measurer and results of measurement of the temperature of the processed gas and the ingredients of the processed gas from the exhaust gas measurer and controlling the gas supply based on the measurement results.
    Type: Grant
    Filed: July 12, 2021
    Date of Patent: August 29, 2023
    Assignees: SAMSUNG ELECTRONICS CO., LTD., PureSphere Co., Ltd.
    Inventors: Suji Gim, Sunwoo Yook, Youngduk Ko, Youngseok Roh, Seoyoung Maeng, Jongyong Bae, Jihnkoo Lee, Jungjoon Pyeon, Jongha Hwang
  • Patent number: 11549178
    Abstract: An apparatus and method for treating a semiconductor process gas comprises a gas inlet allowing a treatment target gas (or gas to be treated) to flow therethrough; a catalytic reaction portion including a catalyst and configured to allow the treatment target gas to be brought into contact with the catalyst; a space velocity controller between the gas inlet and the catalytic reaction portion, the space velocity controller extending from the gas inlet in a diagonal direction in relation to the gas inlet; a differential pressure buffer portion between the space velocity controller and the catalytic reaction portion and including a filter; and a gas outlet configured to externally discharge a product formed as the treatment target gas comes into contact with the catalyst.
    Type: Grant
    Filed: October 26, 2021
    Date of Patent: January 10, 2023
    Assignees: Samsung Electronics Co., Ltd., PureSphere Co., Ltd.
    Inventors: Suji Gim, Sunwoo Yook, Youngduk Ko, Youngseok Roh, Seoyoung Maeng, Jongyong Bae, Jihnkoo Lee, Jungjoon Pyeon, Jongha Hwang
  • Publication number: 20220205094
    Abstract: An apparatus and method for treating a semiconductor process gas comprises a gas inlet allowing a treatment target gas (or gas to be treated) to flow therethrough; a catalytic reaction portion including a catalyst and configured to allow the treatment target gas to be brought into contact with the catalyst; a space velocity controller between the gas inlet and the catalytic reaction portion, the space velocity controller extending from the gas inlet in a diagonal direction in relation to the gas inlet; a differential pressure buffer portion between the space velocity controller and the catalytic reaction portion and including a filter; and a gas outlet configured to externally discharge a product formed as the treatment target gas comes into contact with the catalyst.
    Type: Application
    Filed: October 26, 2021
    Publication date: June 30, 2022
    Applicants: Samsung Electronics Co., Ltd., PureSphere Co.,Ltd.
    Inventors: Suji GIM, Sunwoo YOOK, Youngduk KO, Youngseok ROH, Seoyoung MAENG, Jongyong BAE, Jihnkoo LEE, Jungjoon PYEON, Jongha HWANG
  • Publication number: 20220203290
    Abstract: An exhaust gas processing system including a process chamber in which an exhaust gas is produced; an exhaust gas measurer receiving the exhaust gas and measuring a concentration of the exhaust gas; a solid producing gas processor receiving the exhaust gas and removing a solid producing gas contained in the exhaust gas; a gas supply supplying dilution and cooling gases to the solid producing gas processor; a processed gas measurer receiving, as a processed gas, the exhaust gas free of the solid producing gas and measuring a temperature of the processed gas and ingredients of the processed gas; and a controller receiving results of measurement of the concentration of the exhaust gas from the exhaust gas measurer and results of measurement of the temperature of the processed gas and the ingredients of the processed gas from the exhaust gas measurer and controlling the gas supply based on the measurement results.
    Type: Application
    Filed: July 12, 2021
    Publication date: June 30, 2022
    Applicant: PureSphere Co., Ltd.
    Inventors: Suji GIM, Sunwoo YOOK, Youngduk KO, Youngseok ROH, Seoyoung MAENG, Jongyong BAE, Jihnkoo LEE, Jungjoon PYEON, Jongha HWANG