Abstract: A grid (10) for use in electron microscopy to analyze samples (S), wherein said grid extends along a plane Po and comprises a mesh region (100) for receiving the samples and an edge region (200) surrounding said mesh region; wherein the mesh region is provided with one or more dome shaped relief regions (110) configured for holding the samples, said dome shaped relief regions extending out of the plane and being located at a distance from the edge region of the grid.
Type:
Application
Filed:
February 9, 2024
Publication date:
August 6, 2026
Applicant:
Puxano BV
Inventors:
Wouter VAN PUTTE, Marie-Aline MATTELIN, Benjamin HUET