Patents Assigned to Q-Vis Limited
  • Patent number: 7001018
    Abstract: A fixation apparatus is provided that limits rotation of the ocular globe of an eye, to facilitate alignment of an instrument with the axis of astigmatism of the eye. The apparatus includes fixation target means (12) for locating in the field of view of the eye so that the eye may fixate on the target. The fixation target means includes or consists of at least one elongate component (16). Also disclosed is a corresponding method, and method and apparatus for supplying visual feedback to an operator during refractive surgery of an eye of a patient.
    Type: Grant
    Filed: August 16, 1999
    Date of Patent: February 21, 2006
    Assignee: Q-Vis Limited
    Inventor: Simon Charles Martin
  • Publication number: 20050171514
    Abstract: Apparatus for performing ultraviolet laser ablation of a surface, eg. an eye surface, including a laser delivery system (7) having a laser source (1) for generating a laser beam (2) and optics for applying the laser beam to the surface to be ablated, means (20, 20?) for providing a compatible liquid (32) in contact with the surface (4a) to be ablated, in a position whereby said laser beam (2) is applied to said surface through the liquid, wherein the laser beam is of a wavelength that substantially is not absorbed by the liquid.
    Type: Application
    Filed: March 24, 2005
    Publication date: August 4, 2005
    Applicant: Q-Vis Limited
    Inventor: Paul Van Saarloos
  • Patent number: 6843788
    Abstract: A method of treating a surface by laser ablation to modify selected regions of the surface, while other regions of the surface not to be substantially ablated are protected from the laser beam by a masking fluid, wherein the masking fluid comprises a solution of a pharmaceutically acceptable pyrido benzoxazine compound or derivative thereof effective as a masking agent.
    Type: Grant
    Filed: April 17, 2002
    Date of Patent: January 18, 2005
    Assignee: Q-Vis Limited
    Inventors: Geoffrey Thomas Dair, Hank Christian Sciberras, Sharon Lee Humphris
  • Patent number: 6369898
    Abstract: Method and apparatus are provided for measuring the surface profile of a sample. The method and apparatus provide light from a light source through a beam splitter to form two split beams, direct the split beams onto a sample surface and a reference surface respectively, reflect the split beams back through the beam splitter, and direct the split beams towards an imaging system. A surface profiling apparatus for measuring the surface profile of the sample is also provided. The apparatus includes a light source for generating a source beam, beam splitting means positioned in the path of the source beam for splitting the source beam into split beams, a reference surface, a sample surface allowing the split beams to traverse separate paths and return to the beam splitting means, reference surface positioning means for positioning the reference surface, and viewing means for imaging combined beams.
    Type: Grant
    Filed: January 18, 2000
    Date of Patent: April 9, 2002
    Assignee: Q-Vis Limited
    Inventors: Paul Phillip Van Saarloos, David Clyde MacPherson