Abstract: An improvement to electrical circuit test probes of the type wherein a socket tube having a cylindrical spring loaded plunger therein is mounted in a test fixture. Electrical contact is assured between the socket and the plunger as the plunger moves longitudinally by the plunger having a resiliently flexible wand extending inwardly therefrom at an angular offset to the longitudinal axis of the plunger and the wand terminating in a bulbous contact member. The contact member is disposed within a cylindrical plunger tube and passes through an opening through which the contact member cannot pass. As a result, the wand acts as a flexible resilient finger holding the contact member firmly against the inner wall of the plunger tube as the plunger is moved in and out through its limits of movement.

Abstract: An electrical connector particularly adapted for use with an electrical circuit test probe. A collet member having facing gripping jaws on one end is adapted to receive an electrical conductor. A plug housing having first and second cylindrical portions interconnected by a tapered portion is adapted to receive the collet member and squeeze the jaws into electrical connection with the conductor as the collet member is pushed into the plug housing. For use with the electrical circuit test probe, the plug housing has a closed cylindrical inner end adapted to be crimped into the end of a socket tube.