Patents Assigned to Quality Control, Inc.
  • X-ray fluorescence measuring system and methods for trace elements
    Patent number: 7200200
    Abstract: An X-ray fluorescence measuring system and related measuring methods are disclosed, the system using X-ray energy at a level of less than 80 KeV may be directed toward a material, such as coal. The energy fluoresced may be detected (10) and used to measure the elemental composition of the material, including trace elements. The material may be moving or stationary.
    Type: Grant
    Filed: September 3, 2002
    Date of Patent: April 3, 2007
    Assignee: Quality Control, Inc.
    Inventors: Melvin J. Laurila, Claus C. Bachmann