Patents Assigned to Quality Vision International, Inc.
  • Patent number: 10794684
    Abstract: A touch probe for sensing the position of a surface, having a housing and a moving assembly supported within the housing and including a flexible reflective element, a spacer element, and a semitransparent element, wherein a reflective surface of the flexible reflective element and a surface of the semitransparent element are separated by the spacer element, and a stylus connected to the flexible reflective element. Movement of the stylus responsive to a force causes the flexible reflective element to flex and change distances between points on the reflective surface and on the surface of the semitransparent element. Coherent light incident upon the semitransparent element and directed towards the reflective surface creates interference fringes dependent upon separation distances between the reflective surface and the surface of the semitransparent element. A detector senses changes in the interference fringes patterns in response to flexing of the flexible element.
    Type: Grant
    Filed: December 11, 2017
    Date of Patent: October 6, 2020
    Assignee: QUALITY VISION INTERNATIONAL INC.
    Inventor: Guglielmo Raho
  • Patent number: 10776950
    Abstract: An alignment system for an imaging sensor of a coordinate measuring machine incorporates a reference surface associated with a stage of the measuring machine but instead of imaging the reference surface as a location marker, the reference surface is incorporated into a combined imaging system together with the imaging sensor for imaging a feature associated with the imaging sensor. The imaged feature can be an internal part of the imaging sensor, such as an internal aperture, or an external feature in a fixed relationship with the imaging sensor, such as a lens hood.
    Type: Grant
    Filed: February 19, 2019
    Date of Patent: September 15, 2020
    Assignee: QUALITY VISION INTERNATIONAL INC.
    Inventor: Eric G. Gesner
  • Patent number: 10701259
    Abstract: A video measurement system includes an imaging system, a reticle projector for projecting an image of a reticle through the imaging system onto the test object, and a camera for capturing images of the test object together with the reticle image projected onto the test object through the imaging system. A selective reflector reflects the reticle image into the camera from a position along the imaging system in advance of the test object. A mode selector is operable in a first mode for directing the reticle image to the test object and from the test object to the camera and is operable in a second mode for directing the reticle image to the selective reflector and from the selective reflector to the camera.
    Type: Grant
    Filed: September 15, 2017
    Date of Patent: June 30, 2020
    Assignee: QUALITY VISION INTERNATIONAL INC.
    Inventor: Stephanie M. Bloch
  • Patent number: 10648797
    Abstract: An optical measuring system for a measuring machine includes at least two scanning devices for intermittently moving through alternately timed sequences of static measuring positions at which a measuring beam is directed to and from a test object. An optical switch selectively routes the measuring beam through any one of the scanning devices that has settled into one of the static measuring positions.
    Type: Grant
    Filed: November 16, 2017
    Date of Patent: May 12, 2020
    Assignee: QUALITY VISION INTERNATIONAL INC.
    Inventor: Daniel James Lawler Williams
  • Patent number: 10579890
    Abstract: A method of aligning a 3D CAD model to a test object in a machine vision system comprising steps of orienting the 3D CAD model in a model window, placing the test object on a motion stage in an orientation approximately matching the orientation of the 3D model, taking a video image of the test object with the video camera and extracting a peripheral boundary in a datum plane normal to the viewing axis of the video camera, extracting a silhouette boundary of the 3D model in a corresponding datum plane, relatively positioning the silhouette boundary of the 3D model to match the peripheral boundary of the test object using a fitting algorithm, and matching coordinates of points in the 3D model to coordinates of corresponding points of the test object referenced within the corresponding datum plane and along the viewing axis.
    Type: Grant
    Filed: February 7, 2018
    Date of Patent: March 3, 2020
    Assignee: QUALITY VISION INTERNATIONAL INC.
    Inventors: Edward T. Polidor, Attila Prokai
  • Patent number: 10443998
    Abstract: A recess or “pocket” is formed in at least one leg of a moving bridge assembly of a coordinate measuring machine, and in a particular embodiment in a primary leg of a moving bridge assembly, to permit a quill to move farther in the X direction to an end of a planar base surface of the coordinate measuring machine adjacent the leg without interfering with the leg. The recess formed in the leg of the moving bridge assembly permits coordinate measurements of a part whose width covers the full area of the planar surface of the base, without necessarily adding significant cost or increasing the footprint of the measurement system.
    Type: Grant
    Filed: September 1, 2017
    Date of Patent: October 15, 2019
    Assignee: Quality Vision International, Inc.
    Inventor: Guglielmo Raho
  • Patent number: 10444003
    Abstract: An interferometric measuring machine includes an exchangeable lens module system for an optical probe. The probe includes a lens body containing the optical apparatus of an interferometer and a lens module containing an objective lens along an object arm of the interferometer that can be exchanged with other lens modules for varying the measuring characteristics of the probe. The lens modules are adapted to accommodate objective lenses having different focal lengths while maintaining a desired optical path length of the object arm of the interferometer.
    Type: Grant
    Filed: February 14, 2019
    Date of Patent: October 15, 2019
    Assignee: Quality Vision International, Inc.
    Inventor: David B. Kay
  • Patent number: 10401165
    Abstract: An articulated sensor head includes three different sensor modules. A first of the sensor modules is carried on an extended shank that is mounted in a pivotable fashion from an articulating wrist. A housing carrying a second and a third of the sensor modules is releasably fastened to the extended shank. The second and third sensor modules are carried by the housing in a fixed angular orientation with respect to an orientation of the first sensor module.
    Type: Grant
    Filed: January 9, 2019
    Date of Patent: September 3, 2019
    Assignee: Quality Vision International, Inc.
    Inventors: Edward T. Polidor, Kenneth L. Sheehan, Joseph C. LaPlaca
  • Patent number: 10254105
    Abstract: An interferometric measuring machine includes an exchangeable lens module system for an optical probe. The probe includes a lens body containing the optical apparatus of an interferometer and a lens module containing an objective lens along an object arm of the interferometer that can be exchanged with other lens modules for varying the measuring characteristics of the probe. The lens modules are adapted to accommodate objective lenses having different focal lengths while maintaining a desired optical path length of the object arm of the interferometer.
    Type: Grant
    Filed: December 5, 2016
    Date of Patent: April 9, 2019
    Assignee: Quality Vision International, Inc.
    Inventor: David B. Kay
  • Patent number: 10222207
    Abstract: An articulated sensor head includes three different sensor modules. A first of the sensor modules is carried on an extended shank that is mounted in a pivotable fashion from an articulating wrist. A housing carrying a second and a third of the sensor modules is releasably fastened to the extended shank. The second and third sensor modules are carried by the housing in a fixed angular orientation with respect to an orientation of the first sensor module.
    Type: Grant
    Filed: September 9, 2017
    Date of Patent: March 5, 2019
    Assignee: Quality Vision International, Inc.
    Inventors: Edward T. Polidor, Kenneth L. Sheehan, Joseph C. LaPlaca
  • Patent number: 10126540
    Abstract: A method of focusing a telecentric imaging system (30), particularly as a part of a measuring machine (10) includes measuring an image of a feature (25) of an object (24) through the telecentric imaging system (30) in a telecentric operating mode and measuring an image of the feature (25) of the object (24) through the telecentric imaging system (30) in a non-telecentric operating mode. A value is acquired characterizing a function by which the size of the imaged feature varies in the non-telecentric mode with the relative displacement of the object (24) through the depth of field (D). The measures of the image of the feature (25) of the object (24) in the telecentric and non-telecentric modes are related to each other and to the acquired value as an estimate of a relative displacement of the object (24) from the best focus position.
    Type: Grant
    Filed: October 21, 2016
    Date of Patent: November 13, 2018
    Assignee: Quality Vision International, Inc.
    Inventors: David E. Lawson, Stephanie M. Bloch
  • Patent number: 10107614
    Abstract: An optical pen for an optical measurement system includes a probe body arranged to be adjustably mounted in a measuring machine for optically measuring a test object. A single mode fiber optically coupled within the pen body transmits a source beam having an instantaneous or sequentially established bandwidth spanning a range of wavelengths to the pen body and also transmits a measurement beam from the pen body toward a detector. A combination and configuration of optics within the pen body provides a more compact and efficient optical pen.
    Type: Grant
    Filed: April 18, 2017
    Date of Patent: October 23, 2018
    Assignee: Quality Vision International, Inc.
    Inventor: David B. Kay
  • Patent number: 10107615
    Abstract: A probe for an optical measurement system includes a probe body arranged to be adjustably mounted in a measuring machine for optically measuring a test object. A single mode fiber optically coupled within the probe body transmits a source beam having an instantaneous or sequentially established bandwidth spanning a range of wavelengths to the probe body and also transmits a measurement beam from the probe body toward a detector. An adjustable beam manipulator within the probe body spatially excludes portions of the reference beam over a progression of different size portions from being focused within the acceptance cone of the single mode fiber to more closely balance the intensities of the reflected object beam and the reflected reference beam within the measurement beam.
    Type: Grant
    Filed: April 20, 2016
    Date of Patent: October 23, 2018
    Assignee: Quality Vision International, Inc.
    Inventor: David B. Kay
  • Patent number: 9878413
    Abstract: A counterbalance and drive system for a machine slide mechanism includes a counterbalance system having a first flexible connector suspended from a machine mount and interconnecting a slide mechanism and a counterweight and a drive system having a second flexible connector suspended from the machine mount and interconnecting the slide mechanism and the counterweight. The drive system includes both a drive motor operatively engaged along a length of the second flexible connector for vertically displacing the slide mechanism and a compliant connector operating within a limited range of compliance that imparts a regulated amount of tension along at least a portion of the length of the second flexible connector between the engagement of the drive motor and the counterweight.
    Type: Grant
    Filed: February 23, 2016
    Date of Patent: January 30, 2018
    Assignee: Quality Vision International, Inc.
    Inventor: Frederick D. Schwab
  • Patent number: 9784564
    Abstract: An optical measurement system includes an optical sensor assembly for measuring an object located beneath the optical sensor assembly. A deployment mechanism is pivotally connected relative to the optical sensor assembly that moves a secondary measurement aid, such as a touch sensor, between a deployed position and a retracted position. When in the retracted position, the secondary measurement aid does not inhibit movement of the optical sensor with respect to the object being measured.
    Type: Grant
    Filed: November 19, 2015
    Date of Patent: October 10, 2017
    Assignee: Quality Vision International, Inc.
    Inventors: Frederick D. Schwab, Edward T. Polidor
  • Publication number: 20150286384
    Abstract: Measurement routines are established for automating multi-sensor measuring machines. Selections of feature types, sensor types, and closest points on computer models information is processed for distinguishing whether the features intended for measurement lie on a boundary or on a surface of the part to be measured. Interactions through a graphical user interface to a code-generating computer allow for the selections to be made and corresponding measurement instructions to be generated.
    Type: Application
    Filed: April 8, 2014
    Publication date: October 8, 2015
    Applicant: Quality Vision International, Inc.
    Inventor: Kenneth L. Sheehan
  • Patent number: 9091523
    Abstract: A profilometer incorporating a partial coherence interferometer directs a beam containing a band of wavelengths along object and reference arms of the interferometer into respective engagements with a test object surface and a reference object surface en route to a spectrometer for measuring a spectrum of the beam. Within the object arm, the test object surface is relatively moved through a range of positions offset from a null position at which optical path lengths of the object and reference arms are equal. Modulation frequencies of the beam spectrum are calculated at a succession of different focus spot positions across the test object surface. Changes in the modulation frequency are interpreted to distinguish between optical path length differences at which the optical path length of the object arm is longer or shorter than the optical path length of the reference arm.
    Type: Grant
    Filed: July 19, 2013
    Date of Patent: July 28, 2015
    Assignee: Quality Vision International, Inc.
    Inventor: David B. Kay
  • Patent number: 9019511
    Abstract: A coordinate measurement machine having a feeler whose position is determined optically and a lens for use in such a machine and a method for making a lens for a coordinate measurement machine, having a flexible feeler having a sensing tip, positioned substantially at the focal point of the objective lens.
    Type: Grant
    Filed: February 27, 2012
    Date of Patent: April 28, 2015
    Assignee: Quality Vision International, Inc.
    Inventor: Edward T. Polidor
  • Patent number: 9009985
    Abstract: A probe deployment mechanism of a coordinate measuring machine provides for extending and retracting a probe. The probe is displaceable with respect to the actuator body connected to the measuring machine. A locator coupling secures the probe to the actuator body at the extended position for taking measurements. A drive coupled to the probe displaces the probe between the extended and retracted positions but at the extended position, the drive is releasable from the probe for kinetically isolating the locator coupling.
    Type: Grant
    Filed: April 30, 2013
    Date of Patent: April 21, 2015
    Assignee: Quality Vision International, Inc.
    Inventors: William E. Stevens, Jason Patti, David E. Lawson
  • Publication number: 20150022817
    Abstract: A profilometer incorporating a partial coherence interferometer directs a beam containing a band of wavelengths along object and reference arms of the interferometer into respective engagements with a test object surface and a reference object surface en route to a spectrometer for measuring a spectrum of the beam. Within the object arm, the test object surface is relatively moved through a range of positions offset from a null position at which optical path lengths of the object and reference arms are equal. Modulation frequencies of the beam spectrum are calculated at a succession of different focus spot positions across the test object surface. Changes in the modulation frequency are interpreted to distinguish between optical path length differences at which the optical path length of the object arm is longer or shorter than the optical path length of the reference arm.
    Type: Application
    Filed: July 19, 2013
    Publication date: January 22, 2015
    Applicant: Quality Vision International, Inc.
    Inventor: David B. Kay