Patents Assigned to Qualtronics Corporation
  • Patent number: 4690569
    Abstract: Apparatus and method for implementing a characterized thermal profile upon a temperature/time dependent process on any material or materials susceptible to such thermal processing in accordance with a closed loop environmental feedback system and a corresponding predetermined characterized thermal profile.
    Type: Grant
    Filed: May 22, 1986
    Date of Patent: September 1, 1987
    Assignee: Qualtronics Corporation
    Inventor: Randall C. Veitch