Patents Assigned to QuanScan, Inc.
  • Patent number: 5009111
    Abstract: A force measurement apparatus that provides means to compensate for thermal or other disturbances. The apparatus utilizes non-contact electron transfer mechanisms to provide indications of force sensed on a test mass. A plurality of electrodes are used in a differential measurement mode to provide self-zeroing and distortion compensation.
    Type: Grant
    Filed: August 31, 1988
    Date of Patent: April 23, 1991
    Assignee: Quanscan, Inc.
    Inventors: Paul West, Mirik Hovsepian, Ronald Thomas
  • Patent number: 4968914
    Abstract: The electromechanical translation apparatus includes a translation drive assembly driven by front and rear piezoelectric clamping members coupled together with central extension piezoelectric members, which negotiate an elongated stationary channel. The translation drive assembly may directly carry an object for precise linear positioning in one dimension, or may carry a movable channel which in turn may be translated along an axis perpendicular to the direction of the stationary channel, so that an object placed upon the movable channel can be precisely positioned in two dimensions.
    Type: Grant
    Filed: March 24, 1989
    Date of Patent: November 6, 1990
    Assignee: Quanscan, Inc.
    Inventors: Paul E. West, Arthur Young
  • Patent number: 4956817
    Abstract: A high density computer memory which utilizes a probe operating with two degrees of freedom over a memory area, the probe location altered by drive systems incorporating piezoelectric elements arranged to drive the probe parallel to the plane of the memory surface. Sensors to provide an indication of the location of the probe independent of the drive system are provided. The memory system incorporates an underlying substrate upon which is deposited one of a variety of elements or compounds chosen to effect a change in physical-chemical properties when a data bit is written on the surface. The probe is moved over the surface at a distance which produces a current from Schottky or Field effect.
    Type: Grant
    Filed: May 26, 1988
    Date of Patent: September 11, 1990
    Assignee: QuanScan, Inc.
    Inventors: Paul E. West, Jamshid Jahanmir
  • Patent number: 4952857
    Abstract: The scanning micromechanical probe control system for controlling relative movement between a sensor probe and an adjacent sample surface includes a sensor probe for measuring a parameter which varies relative to the relative positioning of the probe and the adjacent surface adapted to generate an error signal indicating one of at least two discrete position conditions; an up/down counter for integrating the error signal and for generating an up/down count signal; and a position control servo for controlling the relative positioning of the probe and the surface responsive to the up/down count signal. An adaptive feedback control most preferably controls the rate of up/down positioning of the sensor probe and the rate of raster scanning of the probe relative to the target surface.
    Type: Grant
    Filed: March 24, 1989
    Date of Patent: August 28, 1990
    Assignee: QuanScan, Inc.
    Inventors: Paul E. West, Wilfred P. Charette, Arthur Young