Patents Assigned to Quantech, Inc.
  • Publication number: 20210025859
    Abstract: A method using ascorbic acid (Vitamin C) as part of a chemical test kit employing sodium rhodizonate as the coloring agent for producing a yellow-orange to purple color transition for detection of lead in various media eliminating the use of strong acid.
    Type: Application
    Filed: July 25, 2019
    Publication date: January 28, 2021
    Applicant: QuanTech, Inc.
    Inventors: Frederic G. Dewalt, David C. Cox
  • Publication number: 20140004614
    Abstract: A method of changing the response level for any chemical test kits designed for the determination of a metal or compound (such as lead) in paint and other media is disclosed. The invention solves two common problems that exist with using chemical test kits for the detection of lead in paint or other coatings and media: (1) conversion of the paint sample into particles small enough to dissolve the metal in the sample; and, (2) controlling the amount of (paint) sample that gets exposed to the chemicals. This is accomplished by using a coffee grinder or equivalent tool plus a solid (food) product to break up the paint sample into small particles and at the same time dilute the concentration of the metal, while in solid form, down to a level that results in obtaining a positive response at the desired concentration.
    Type: Application
    Filed: June 30, 2012
    Publication date: January 2, 2014
    Applicant: QUANTECH, INC.
    Inventors: Frederic G. Dewalt, David C. Cox
  • Patent number: 7038446
    Abstract: An apparatus and method is disclosed for inspecting contours formed along a predetermined region of a surface on a workpiece formed of an electrically conductive material using eddy current. A probe includes a longitudinal axis and is moveable along a path of travel to a static testing position stationary with respect to the predetermined region to be inspected on a workpiece. At least two coils are spaced longitudinally from one another and supported by the probe to be electrically excited with a predetermined frequency and amplitude while at the static testing position with the stationary probe. Sensors are provided for measuring the excitation voltage of each coil as eddy currents are induced in the electrically conductive material of the workpiece by the coils supported on the probe stationary at the static testing position with respect to the workpiece.
    Type: Grant
    Filed: November 26, 2003
    Date of Patent: May 2, 2006
    Assignee: Quantech, Inc.
    Inventor: William Keely
  • Patent number: 6703831
    Abstract: An apparatus and method for inspecting contours formed along a predetermined region of a surface on a workpiece formed of an electrically conductive material using eddy current. A probe includes a longitudinal axis and is moveable along a path of travel with respect to the predetermined region to be inspected on a workpiece. At least two coils are spaced longitudinally from one another and supported by the probe to be electrically excited with a predetermined frequency and amplitude during movement of the probe along the path. Sensors are provided for measuring the excitation voltage of each coil as eddy currents are induced in the electrically conductive material of the workpiece by the coils supported on the probe moving along the path of travel with respect to the workpiece.
    Type: Grant
    Filed: October 3, 2000
    Date of Patent: March 9, 2004
    Assignee: Quantech, Inc.
    Inventors: William A. Keely, Randall H. Field