Patents Assigned to Quantum Precision Instruments Asia PTE LTD
  • Patent number: 8033091
    Abstract: A monolithic micro or nano electromechanical transducer device includes a pair of substrates (20, 25) respectively mounting one or more elongate electrical conductors (40) and resilient solid state hinge means (30, 32) integral with and linking the substrates to relatively locate the substrates so that respective elongate electrical conductors (40) of the substrates are opposed at a spacing that permits a detectable quantum tunnelling current between the conductors when a suitable electrical potential difference is applied across the conductors. The solid state hinge means permits relative parallel translation of the substrates transverse to the elongate electrical conductors.
    Type: Grant
    Filed: April 22, 2004
    Date of Patent: October 11, 2011
    Assignee: Quantum Precision Instruments Asia PTE Ltd.
    Inventors: Marek Michalewicz, Zygmunt Rymuza
  • Patent number: 7782148
    Abstract: An apparatus for manipulating or modifying electromagnetic waves or electromagnetic waves or a beam of particles, eg atoms, ions, molecules or charged particles, the apparatus comprising a micro or nano electrical conductor crossbar network having multiple cross-over junctions that define respective scattering points for electromagnetic waves or the particles of the beam. At least one structural parameter of the crossbar network is selectively tuneable to obtain a desired manipulation or modification of said wave or beam when incident on the network in a pre-determined directional electrical conductor crossbar network (10) configured as an atomic beam diffraction grating. The direction of wave propagation of the atomic beam is indicated by the arrow (15).
    Type: Grant
    Filed: September 12, 2005
    Date of Patent: August 24, 2010
    Assignee: Quantum Precision Instruments Asia PTE LTD
    Inventor: Marek Tadeusz Michalewicz