Patents Assigned to Quest Metrology, LLC
  • Patent number: 10036629
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: March 22, 2017
    Date of Patent: July 31, 2018
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Publication number: 20170191824
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Application
    Filed: March 22, 2017
    Publication date: July 6, 2017
    Applicant: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Patent number: 9638517
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: May 2, 2017
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Patent number: 9234748
    Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: January 12, 2016
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Patent number: 8860952
    Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Grant
    Filed: June 11, 2012
    Date of Patent: October 14, 2014
    Assignee: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Publication number: 20120314223
    Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.
    Type: Application
    Filed: June 11, 2012
    Publication date: December 13, 2012
    Applicant: Quest Metrology, LLC
    Inventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
  • Patent number: 8164758
    Abstract: In some embodiments, an inspection system for measuring at least a portion of the threaded surface of an internally threaded component includes at least one measuring probe, a component retention device that allows positioning of the internally threaded component relative to the measuring probe and a processing device in signal communication with the measuring probe to receive threaded surface data therefrom.
    Type: Grant
    Filed: July 10, 2009
    Date of Patent: April 24, 2012
    Assignee: Quest Metrology, LLC
    Inventors: Stanley P. Johnson, Phillip D. Bondurant
  • Patent number: 8039827
    Abstract: In some embodiments, an inspection system includes a collimated light source defining a source optical path and useful to cause a collimated light beam to propagate along the source optical path and a sensing device defining a sensor optical path. A positioning device includes a positioning device stage movably disposed relative to the positioning device, sensing device and collimated light source. A retention mount is disposed on the positioning device stage and within the sensor optical path such that when an object is retained within the retention mount, the object blocks at least a portion of the collimated light beam.
    Type: Grant
    Filed: March 13, 2010
    Date of Patent: October 18, 2011
    Assignee: Quest Metrology, LLC
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Patent number: 8035094
    Abstract: A method for measuring the physical characteristics of a component includes associating a component with the system such that the component is positioned within the retention mount and operating the system to cause the light source to emit a collimated light beam along a source optical path, where the collimated light beam is reflected to cause a reflected collimated light beam to propagate along a sensor optical path to be incident upon the component to produce a component silhouette where the sensing device generates data responsive to the silhouette. The image data is processed to generate resultant data responsive to the component, wherein the resultant data is further responsive to at least one of a smoothing algorithm, a functional size algorithm and a centering algorithm.
    Type: Grant
    Filed: March 20, 2009
    Date of Patent: October 11, 2011
    Assignee: Quest Metrology, LLC
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky