Patents Assigned to Quest Metrology, LLC
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Patent number: 10036629Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.Type: GrantFiled: March 22, 2017Date of Patent: July 31, 2018Assignee: Quest Metrology, LLCInventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
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Publication number: 20170191824Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.Type: ApplicationFiled: March 22, 2017Publication date: July 6, 2017Applicant: Quest Metrology, LLCInventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
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Patent number: 9638517Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.Type: GrantFiled: December 8, 2015Date of Patent: May 2, 2017Assignee: Quest Metrology, LLCInventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
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Patent number: 9234748Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.Type: GrantFiled: August 29, 2014Date of Patent: January 12, 2016Assignee: Quest Metrology, LLCInventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
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Patent number: 8860952Abstract: An apparatus configured to measure at least one physical characteristic of a threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.Type: GrantFiled: June 11, 2012Date of Patent: October 14, 2014Assignee: Quest Metrology, LLCInventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
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Publication number: 20120314223Abstract: An apparatus configured to measure at least one physical characteristic of an threaded surface (e.g., an internally threaded surface) of an object is provided. The apparatus uses optical triangulation to perform non-contact characterization of the threaded surface. The apparatus can be used to characterize various aspects of the threaded surface, including generating the measurements required to produce a longitudinal cross-sectional profile of the threaded surface.Type: ApplicationFiled: June 11, 2012Publication date: December 13, 2012Applicant: Quest Metrology, LLCInventors: Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz, David Jack Savage
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Patent number: 8164758Abstract: In some embodiments, an inspection system for measuring at least a portion of the threaded surface of an internally threaded component includes at least one measuring probe, a component retention device that allows positioning of the internally threaded component relative to the measuring probe and a processing device in signal communication with the measuring probe to receive threaded surface data therefrom.Type: GrantFiled: July 10, 2009Date of Patent: April 24, 2012Assignee: Quest Metrology, LLCInventors: Stanley P. Johnson, Phillip D. Bondurant
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Patent number: 8039827Abstract: In some embodiments, an inspection system includes a collimated light source defining a source optical path and useful to cause a collimated light beam to propagate along the source optical path and a sensing device defining a sensor optical path. A positioning device includes a positioning device stage movably disposed relative to the positioning device, sensing device and collimated light source. A retention mount is disposed on the positioning device stage and within the sensor optical path such that when an object is retained within the retention mount, the object blocks at least a portion of the collimated light beam.Type: GrantFiled: March 13, 2010Date of Patent: October 18, 2011Assignee: Quest Metrology, LLCInventors: Stanley P. Johnson, Lawrence J. Zagorsky
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Patent number: 8035094Abstract: A method for measuring the physical characteristics of a component includes associating a component with the system such that the component is positioned within the retention mount and operating the system to cause the light source to emit a collimated light beam along a source optical path, where the collimated light beam is reflected to cause a reflected collimated light beam to propagate along a sensor optical path to be incident upon the component to produce a component silhouette where the sensing device generates data responsive to the silhouette. The image data is processed to generate resultant data responsive to the component, wherein the resultant data is further responsive to at least one of a smoothing algorithm, a functional size algorithm and a centering algorithm.Type: GrantFiled: March 20, 2009Date of Patent: October 11, 2011Assignee: Quest Metrology, LLCInventors: Stanley P. Johnson, Lawrence J. Zagorsky