Patents Assigned to Quiss GmbH
  • Patent number: 8538125
    Abstract: A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.
    Type: Grant
    Filed: December 23, 2004
    Date of Patent: September 17, 2013
    Assignee: Quiss GmbH
    Inventors: Jan Anders Linnenkohl, Andreas Tomtschko, Mirko Berger, Roman Raab
  • Patent number: 8400503
    Abstract: A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.
    Type: Grant
    Filed: July 16, 2004
    Date of Patent: March 19, 2013
    Assignee: Quiss GmbH
    Inventors: Jan Anders Linnenkohl, Andreas Tomtschko, Mirko Berger, Roman Raab
  • Patent number: 8137738
    Abstract: Disclosed is a method or device for recognizing a structure, preferably a bead or trace of adhesive material (20), which is to be applied to a substrate (30), with the aid of at least two cameras, more particularly three or more cameras (12, 13, 14). The structure, which is to be applied, is applied to the substrate using an applicator device (11), whereupon the structure, which is applied to the substrate by means of the applicator device, is monitored by the cameras in such a way that the cameras are oriented towards the applied structure with at least one overlapping area, wherein the applied structure, particularly the edges of the trace of adhesive, is determined on a revolving orbit around the applicator device and the revolving orbit is pre-defined in such a way that the applied structure intersects the revolving orbit after it has been applied to the substrate.
    Type: Grant
    Filed: December 23, 2004
    Date of Patent: March 20, 2012
    Assignee: Quiss GmbH
    Inventors: Jan Anders Linnenkohl, Andreas Tomtschko, Mirko Berger, Roman Raab
  • Patent number: 7875137
    Abstract: A method for applying and monitoring an application structure comprising a repairing function and device thereof are provided. The method includes arranging automatically a first application structure on the substrate using the application device. The first application structure on the substrate monitored by the at least one camera such that the at least one camera is constantly aligned to the first application structure and the first application structure. The method further includes transmitting the images acquired by the at least one camera to an image processing device that analyzes the images of the first application structure and the image processing device filing partial areas of the first application structure. The method also includes applying, after application of all partial areas of the first application structure, at least a second application structure to the substrate by the application device based on the repair list.
    Type: Grant
    Filed: April 18, 2007
    Date of Patent: January 25, 2011
    Assignee: Quiss GmbH
    Inventor: Bernhard Gruber
  • Publication number: 20070292629
    Abstract: Disclosed is a method or device for recognizing a structure, preferably a bead or trace of adhesive material (20), which is to be applied to a substrate (30), with the aid of at least two cameras, more particularly three or more cameras (12, 13, 14). The structure, which is to be applied, is applied to the substrate using an applicator device (11), whereupon the structure, which is applied to the substrate by means of the applicator device, is monitored by the cameras in such a way that the cameras are oriented towards the applied structure with at least one overlapping area, wherein the applied structure, particularly the edges of the trace of adhesive, is determined on a revolving orbit around the applicator device and the revolving orbit is pre-defined in such a way that the applied structure intersects the revolving orbit after it has been applied to the substrate.
    Type: Application
    Filed: December 23, 2004
    Publication date: December 20, 2007
    Applicant: QUISS GMBH
    Inventors: Jan Linnenkohl, Andreas Tomtschko, Mirko Berger, Roman Raab