Abstract: The invention pertains to method and apparatus for specimen preparation, in conjunction with which at least one specimen surface is produced on a test piece embedded, if required, in a casting-resin mounting medium through chip or slice removal of material and wherein the examined specimen surface is milled; especially, a method for the preparation of hard objects, and/or objects exhibiting differential hardness over the specimen surface, for electron scan microscopic and X-Ray studies. The invention further includes apparatus for preparing a specimen for examination which includes a milling head.

Abstract: The invention pertains to method and apparatus for specimen preparation, in conjunction with which at least one specimen surface is produced on a test piece embedded, if required, in a casting-resin mounting medium through chip or slice removal of material and wherein the examined specimen surface is milled; especially, a method for the preparation of hard objects, and/or objects exhibiting differential hardness over the specimen surface, for electron scan microscopic and X-Ray studies. The invention further includes apparatus for preparing a specimen for examination which includes a milling head.