Patents Assigned to R2 Technology
  • Patent number: 7359538
    Abstract: An algorithm is disclosed that detects and analyzes possible lesions that are left in contact with a structural boundary. A morphological closing with a structuring element is performed along the boundary to detect lesions within the threshold of the structuring element. A deformable surface-based analysis is performed on distinctive surfaces of the structure for the identification of lesions. The integrated use of a deformable surface model and chamfer distance potential enables explicit representation of regularized, or smoothed, surfaces from which lesion candidates may be detected.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: April 15, 2008
    Assignee: R2 Technology
    Inventors: Xiaolan Zeng, Wei Zhang