Abstract: Systems and methods for illuminating and/or inspecting one or more features of a unit under test (UUT) are disclosed herein. A system configured in accordance with embodiments of the present technology can include, for example, a machine, one or more diffuser elements, and/or one or more light sources. The system can create and adjust brightfield illumination profiles (e.g., uniform, brightfield illumination profiles) on portions (e.g., on curved features) of the UUT by, for example, using the one or more light sources and/or the one or more diffuser elements to adjust diffuse and/or specular illumination projected onto the curved features of the UUT. In some embodiments, the system includes one or more darkfield light sources configured to project illumination onto second portions of the UUT to create a darkfield illumination profile. The system can capture data of the brightfield and/or darkfield illumination profiles and can thereby inspect portions of the UUT.

Abstract: Systems and methods for measuring characteristics of an electronic visual display are disclosed herein. A method configured in accordance with embodiments of the present technology for measuring an electronic visual display can include, for example, analyzing a region of interest (“ROI”) in an image taken of at least a portion of the electronic visual display. The method determines a center and bounds of the ROI that are, in general, floating point values rather than whole pixel locations. The method then samples whole imaging device pixels and/or fractional imaging device pixels within the bounds of the ROI and determines whether the pixels and/or fractional pixels fall within, outside, or partially within the ROI. Depending on the position of the pixels and/or fractional pixels relative to the ROI, the pixels and/or fractional pixels can be weighted and/or summed to determine an overall image characteristic for the ROI.

Abstract: Systems and methods for illuminating and/or inspecting one or more features of a unit under test (UUT) are disclosed herein. A system configured in accordance with embodiments of the present technology can include, for example, a machine, one or more diffuser elements, and/or one or more light sources. The system can create and adjust brightfield illumination profiles on portions of the UUT by, for example, using the one or more light sources and/or the one or more diffuser elements to adjust diffuse and/or specular illumination projected onto the curved features of the UUT. In some embodiments, the system includes one or more darkfield light sources configured to project illumination onto second portions of the UUT to create a darkfield illumination profile. The system can capture data of the brightfield and/or darkfield illumination profiles and can thereby inspect portions of the UUT.

Abstract: The present disclosure relates to methods and systems for measuring and correcting electronic visual displays. A method in accordance with one embodiment of the present technology includes generating a series of patterns for illuminating proper subsets of the light emitting elements of the display, such as regular grids of nonadjacent activated light emitting elements with the elements in between deactivated. For each generated pattern, an imaging device captures information about the activated light emitting elements. A computing device analyzes the captured information, comparing the output of the activated light emitting elements to target output values, and determines correction factors to calibrate the display to better achieve the target output values. In some embodiments, the correction factors may be uploaded to firmware controlling the display or used to process images to be shown on the display.