Abstract: Digital information to be associated with a component can be generated and used to alter a digital model of the component. A line of sight to at least a portion of a marking device and the component can be detected, and at least one of an orientation or a position of an endpoint of the marking device relative to the component can be determined using the line of sight. Digital information indicative of the at least one of the orientation or the position of the endpoint relative to the component can be generated responsive to the endpoint of the marking device contacting the component. The digital information can be used to alter a digital model based on defects of the component corresponding to portions contacted by the endpoint of the marking device.

Abstract: A method and apparatus for detecting machined substrate fragments by thermography. A heat source applies heat to a surface of machined component, the surface providing access to one or more internal chambers within an interior space of the component. The application of heat is sufficient in temperature and duration to cause a fragment temperature elevation rate in at least one machined substrate fragment present in at least one internal chamber that is greater than temperature elevation rate of the component. An IR detection device operably connected to a visual output device captures the IR signal from the component surface following the application of heat and outputs a thermal image of the component. Heat elevation points within the thermal image correspond with the presence of machined substrate fragments within at least one internal chamber of the component.

Abstract: A method and apparatus for detecting machined substrate fragments by thermography. A heat source applies heat to a surface of machined component, the surface providing access to one or more internal chambers within an interior space of the component. The application of heat is sufficient in temperature and duration to cause a fragment temperature elevation rate in at least one machined substrate fragment present in at least one internal chamber that is greater than temperature elevation rate of the component. An IR detection device operably connected to a visual output device captures the IR signal from the component surface following the application of heat and outputs a thermal image of the component. Heat elevation points within the thermal image correspond with the presence of machined substrate fragments within at least one internal chamber of the component.

Abstract: A radar detector is provided including a microwave module, which converts a UHF signal to a RF signal, a RF module, which converts the RF signal to an IF signal, a demodulator, which demodulates the IF signal, and a signal processing controller, which receives a signal demodulated by the demodulator and performs an appropriate control for each constituting component. The microwave module includes an antenna, which receives a UHF signal, a first local oscillating unit, which includes an oscillator and a buffer amplifier, and a first mixing unit, which converts a signal received from the antenna to an RF signal. The first local oscillating unit is supplied with power by a single bias circuit.