Abstract: A method for in-line optical testing is provided. The method includes providing a substrate, forming an optical device on the substrate, and forming a test circuit on the substrate, the test circuit being optically coupled to the optical device. An optical test is performed on the optical device with the test circuit. The test circuit is then removed.

Abstract: A scavenging photodetection device (10) is provided. The scavenging photodetection device (10) includes an optical coupling portion (12) and a scavenging photodetection portion (14). The optical coupling portion (12) includes an optical coupler (16) configured to receive light from a light source, a plurality of light absorbers (18) arranged to absorb the light from the light source that is not collected by the optical coupler (16), and at least one primary input waveguide (20) optically coupled to the optical coupler (16) and configured to direct collected light to a photonic integrated circuit. The scavenging photodetection portion (14) includes a primary photodetector (22) configured to collect uncollected light from the optical coupling portion (12) to determine an alignment position of the photonic integrated circuit.

Abstract: A photonics packaging method is provided. The photonics packaging method includes providing a substrate (10) and attaching a first optical device (12) to the substrate (10). The first optical device (12) includes a first mode converter (14) optically coupled to a first integrated photonics chip (16). A second optical device (32) is also attached to the substrate (10). The second optical device (32) includes a second mode converter (34) optically coupled to a second integrated photonics chip (36). The second optical device (32) is of a greater height than the first optical device (12). An index-matching material (56) is disposed in a space between the first and second optical devices (12) and (32) and a force is applied on the second optical device (32) to cause the second optical mode converter (34) to align with the first optical mode converter (14). The index-matching material (56) is subsequently cured.

Abstract: A photodetector (10) is provided. The photodetector (10) includes an interferometer (12) and a photodetection region (14) coupled to the interferometer (12). The interferometer (12) is configured to generate an optical intensity distribution that corresponds to an electric field distribution in the photodetection region (14).

Abstract: A phase-shifter (10) for optical modulation is provided. The phase-shifter (10) includes a first electrode (12), a second electrode (14), a waveguide (16) in a folded configuration between the first and second electrodes (12, 14), and one or more PN junctions (18, 20) provided with the waveguide (16) and connected to the first and second electrodes (12, 14).

Abstract: A method for in-line optical testing is provided. The method includes providing a substrate (10), forming an optical device (16) on the substrate (10), and forming a test circuit (20) on the substrate (10), the test circuit (20) being optically coupled to the optical device (16). An optical test is performed on the optical device (16) with the test circuit (20). The test circuit (20) is then removed.