Patents Assigned to Randwal Instrument Co., Inc.
  • Patent number: 4542989
    Abstract: A position encoder including a holographically recorded, single-frequency, phase grating. When this phase grating is illuminated by a spatially coherent light source, it acts as a basic common path interferometer and constitutes a highly efficient source of high contrast, stable, interference fringe patterns. In the position encoder, a carrier moves the grating in a plane that is orthogonal to an axis from the light source. Motion of the carrier is detected as the fringe pattern moves past detecting means thereby to sense motion and provide position information in the form of electrical signals.
    Type: Grant
    Filed: February 5, 1982
    Date of Patent: September 24, 1985
    Assignee: Randwal Instrument Co., Inc.
    Inventor: Paul W. Remijan
  • Patent number: 4541697
    Abstract: Optical measuring and testing apparatus incorporates a holographically recorded, single-frequency, optically thin phase grating. When this phase grating is illuminated by a quasi-monochromatic, spatially coherent light source, it acts as a basic common path interferometer and constitutes a highly efficient source for a high contrast, stable, interference fringe pattern. Various apparatus embodiments incorporating the phase grating are described which permit (1) measurement of central and peripheral retinal acuity, (2) variable contrast testing to measure the ability of the eye to detect low contrast stimuli, (3) measurement of visually evoked responses to help diagnose retinal-neurological dysfunction, and (4) the testing of optical lenses.
    Type: Grant
    Filed: May 16, 1983
    Date of Patent: September 17, 1985
    Assignee: Randwal Instrument Co., Inc.
    Inventor: Paul W. Remijan
  • Patent number: 4410244
    Abstract: Optical measuring and testing apparatus incorporating a holographically recorded, single-frequency, optically thin phase grating. When this phase grating is illuminated by a quasi-monochromatic spatially coherent light source, it acts as a basic common path interferometer and constitutes a highly efficient source for a high contrast, stable, interference fringe pattern. In one embodiment, elements are repositioned to move the light source with respect to the grating thereby to alter the number of fringes in a given area. In another embodiment, elements are rotated about the optical axis of the apparatus to control the orientation of the fringe pattern. Provision is also made for allowing the examiner to view the patient's eye pupil during testing.
    Type: Grant
    Filed: March 3, 1981
    Date of Patent: October 18, 1983
    Assignee: Randwal Instrument Co., Inc.
    Inventor: Paul W. Remijan
  • Patent number: 4395124
    Abstract: A position encoder including a holographically recorded, single-frequency, phase grating. When this phase grating is illuminated by a quasi-monochromatic spatially coherent light source, it acts as a basic common path interferometer and constitutes a highly efficient source of high contrast, stable, interference fringe patterns. In a position encoder application, a carrier moves the grating in a plane that is orthogonal to an axis from the light source. Motion of the carrier is detected as the fringe pattern moves past detecting means thereby to sense motion and provide position information in the form of electrical signals.
    Type: Grant
    Filed: March 2, 1981
    Date of Patent: July 26, 1983
    Assignee: Randwal Instrument Co., Inc.
    Inventor: Paul W. Remijan