Patents Assigned to Ray Max Technology, Inc.
  • Patent number: 6189373
    Abstract: A scanning force microscope (10) sometimes referred to as an atomic force microscope employs a laser (32) and a cantilever (28) which move proportionally to a moving reference frame (64). A fixed reference frame (11) contains optical components. A scanning mechanism creates relative movement between the fixed and moving reference frames. An optical assembly (114) is included which comprises at least one optical device in the fixed reference frame. The optical assembly permits initial alignment of the laser beam onto the cantilever and also permit the laser beam to follow the moving cantilever.
    Type: Grant
    Filed: October 31, 1998
    Date of Patent: February 20, 2001
    Assignee: Ray Max Technology, Inc.
    Inventor: David J. Ray