Patents Assigned to RayMax Technology, Incorporated
  • Patent number: 5861550
    Abstract: A scanning force microscope (10) sometimes referred to as an atomic force microscope employs a laser (32) and a cantilever (28) which move proportionally to a moving reference frame (64). A fixed reference frame (11) contains optical components. A scanning mechanism creates relative movement between the fixed and moving reference frames. An optical assembly (114) is included which comprises at least one optical device in the fixed reference frame. The optical assembly permits initial alignment of the laser beam onto the cantilever and also permit the laser beam to follow the moving cantilever.
    Type: Grant
    Filed: October 14, 1997
    Date of Patent: January 19, 1999
    Assignee: RayMax Technology, Incorporated
    Inventor: David J. Ray