Patents Assigned to RDSPI, L.P.
  • Method for determining formation quality factor from seismic data
    Patent number: 6931324
    Abstract: A method is disclosed for calculating the quality factor Q from a seismic data trace. The method includes calculating a first and a second minimum phase inverse wavelet at a first and a second time interval along the seismic data trace, synthetically dividing the first wavelet by the second wavelet, Fourier transforming the result of the synthetic division, calculating the logarithm of this quotient of Fourier transforms and determining the slope of a best fit line to the logarithm of the quotient.
    Type: Grant
    Filed: October 16, 2003
    Date of Patent: August 16, 2005
    Assignee: RDSPI, L.P.
    Inventors: M. Turhan Taner, Sven Treitel