Abstract: An inspection apparatus for inspecting wires of an object in which a plurality of x-axis and y-axis wires are arranged perpendicular to each other, each x-axis and y-axis wire having a display wire and tab wire, respectively. The apparatus includes a power supply device supplying an AC signal to the wire as an inspection object; a connecting device being in conductive contact with the tab wire to transmit the AC signal, a first detecting device disposed in a non-contact manner at one end of the display wire and conductively connected to one end of the power supply device, a second detecting device disposed in the non-contact manner and opposed to the display wire and conductively connected to the one end of the power supply device, and a determining device determining quality of the wire on the basis of results of the first and second detecting devices.

Abstract: An inspection jig may include a frame, an electrode body provided with electrodes, conductive contactors having a wire shape, a support block having a facing surface opposite to which an inspection circuit board is disposed, guiding one ends of the contactors to the inspection points of the circuit board mounted on the facing surface, guiding other ends to the electrodes, and configured to move relatively to the frame in a moving direction which crosses the facing surface, biasing parts configured to bias the support block in a direction moving away from the electrode body and close to the circuit board, and a regulating plate disposed between the support block and the frame so as to extend in a direction from the support block to the frame, having elasticity, and having regulation of deformation in a first direction which is parallel to the facing surface and which crosses the extending direction.

Abstract: A method for maintaining a contact of a connection jig for connecting between a target object to be subjected to an electrical test and a testing apparatus configured to conduct the electrical test on the target object includes: detecting a change in voltage upon supply of power for the electrical test to a test point on the target object through the contact; and issuing maintenance information indicating the contact is abnormal, upon detection of a portion where the voltage does not successively rise.

Abstract: An insulation inspection technique for allowing the occurrence of sparks to be detected more satisfactorily and allowing a board in which sparks have occurred to be more satisfactorily detected as being detective is provided. An insulation inspection apparatus detects a voltage induced between insulation inspection target wiring patterns by the application of a voltage during a time period from the start of the voltage application between the insulation inspection target wiring patterns to a predetermined time when the voltage between the insulation inspection target wiring patterns has stabilized. When a voltage drop due to sparks occurring between the insulation inspection target wiring patterns is detected during the time period, the board to be inspected is determined to be defective. In particular, supply current during the time period is set in accordance with the number of inspection points of an upstream wiring pattern of the insulation inspection target wiring patterns.

Abstract: An insulation test apparatus and method for a circuit board having a plurality of wiring patterns formed thereon includes: selection means for selecting wiring patterns to be tested, power supply means for sending a predetermined electrical output between a first object to be measured and a target object to be measured; measurement means for measuring an electrical signal between the first object to be measured and the target object to be measured; and calculation means for calculating the resistance of an insulation failure portion between the first object to be measured and the target object to be measured.

Abstract: A seismic sensor cable 10 for lowering into a subterranean well 15 for acquiring information about seismic, microseismic and mechanical vibration incidents in the subterranean well 15, where the device comprises a first portion 20 that is elongate and has a first length with a proximal end and a distal end that are to be lowered down into a lower part of the subterranean well 15, the first portion 20 having a plurality of electric or electromechanical multicomponent seismic sensors 25 that are connected and distributed over large parts of its first length, and wherein the seismic profiling device 10 further comprises a second portion 30 that is elongate and has a second length with a proximal end that is to be held above the subterranean well 15 and a distal end that is to be lowered down into the upper part of the subterranean well 15, said second portion 30 comprising an optical fibre 35 that runs along large parts of said second portion 30, and an electric cable 40 for conducting electric power from the pr

Abstract: An insulation inspection technique for allowing the occurrence of sparks to be detected more satisfactorily and allowing a board in which sparks have occurred to be more satisfactorily detected as being detective is provided. An insulation inspection apparatus detects a voltage induced between insulation inspection target wiring patterns by the application of a voltage during a time period from the start of the voltage application between the insulation inspection target wiring patterns to a predetermined time when the voltage between the insulation inspection target wiring patterns has stabilized. When a voltage drop due to sparks occurring between the insulation inspection target wiring patterns is detected during the time period, the board to be inspected is determined to be defective. In particular, supply current during the time period is set in accordance with the number of inspection points of an upstream wiring pattern of the insulation inspection target wiring patterns.

Abstract: A method for estimating parameters of a propagating wave field, such as the direction of propagation in 3D space of an acoustic wave from borehole-acoustic data. The estimation technique uses phase delays between recordings made by the individual receivers related to a plane wave travelling across the receiver array. The estimated plane waves include the wave field generated directly by the acoustic source, as well as refracted and reflected components of these fields. The technique can be used with overlapping wave fields. This will provide significant improvements in the quality of formation properties estimated from full-waveform data that are obtained either from wireline or from while-drilling sonic data. The inventive method enables characterization of abnormalities outside multiple casing strings where acoustic signals are transmitted from a source located inside said multiple casing string.

Abstract: Disclosed is a manufacturing method which enables manufacturing of an ultra-fine, thin contact for current inspection jigs. After a gold or gold alloy plating layer is formed, an Ni electroformed layer is formed by electroformation on the outer periphery of the formed plating layer. After a resistant layer is formed on the outer periphery of the Ni electroformed layer, a spiral groove is formed in the resistant layer by laser exposure, and etching is carried out using the resistant layer as a masking material. The Ni electroformed layer is removed from the part of the resistant layer where the spiral groove was formed, and then the resistant layer is removed and the plating layer is removed from the part of the spiral groove section where the Ni electroformed layer was removed. The core material is then removed, leaving the plating layer inside the periphery of the Ni electroformed layer.

Abstract: Provided is a connection terminal that maintains an approximately circular shape before or after a cylindrical part is fixed by resistance welding. The connection terminal used for a connection jig interconnecting target points includes a small-diameter conductive part and a large-diameter cylindrical part disposed to surround the small-diameter conductive part. The small-diameter conductive part has a front end protruding from a front end of the large-diameter cylindrical part. A part of the small-diameter conductive part is joined to a part of the large-diameter cylindrical part. A cutout part is formed in a part of a strip portion around an axis of the cylindrical part that at least includes the portion of the large-diameter cylindrical part which is joined to the small-diameter conductive part.

Abstract: A method for maintaining a contact of a connection jig for connecting between a target object to be subjected to an electrical test and a testing apparatus configured to conduct the electrical test on the target object includes: detecting a change in voltage upon supply of power for the electrical test to a test point on the target object through the contact; and issuing maintenance information indicating the contact is abnormal, upon detection of a portion where the voltage does not successively rise.

Abstract: An insulation test apparatus and method for a circuit board having a plurality of wiring patterns formed thereon includes: selection means for selecting wiring patterns to be tested, power supply means for sending a predetermined electrical output between a first object to be measured and a target object to be measured; measurement means for measuring an electrical signal between the first object to be measured and the target object to be measured; and calculation means for calculating the resistance of an insulation failure portion between the first object to be measured and the target object to be measured.

Abstract: A circuit board testing apparatus detects sparking and partial discharge between wiring patterns on a circuit board to determine if the circuit board is defective. A constant current source feeds a constant current to a wiring pattern to be tested. A voltage measurement part measures the resulting voltage at the wiring pattern. A normal state voltage gradient calculation part calculates a voltage gradient in a normal state where there is no sparking or partial discharge. A determination part determines whether the voltage gradient remains invariant, by comparing voltage measurement results within a predetermined range with an estimated value of the voltage based on the voltage gradient in the normal state. The determination part determines whether a circuit board is defective, on the basis of whether the voltage gradient remains invariant.

Abstract: A fixed abrasive grain wire saw that can improve precision of a cut plane of a workpiece and grinding efficiency and can prolong product life, a method of manufacturing the fixed abrasive grain wire saw, and a method of machining a workpiece by the fixed abrasive grain wire-saw. To fasten abrasive grains to an outer circumferential surface of a metal core wire, a plurality of transfer rollers, in each of which many tiny holes filled with an adhesive are formed, are used to transfer the adhesive to the outer circumferential surface of the core wire to form, on the outer circumferential surface, a plurality of rows of punctiform adhesive layers that are linearly arrayed in the axial direction at regular intervals. The abrasive grains are tentatively fastened to the adhesive layers, after which the abrasive grains are permanently fastened with a metal plated layer formed by electrolytic deposition.

Abstract: A circuit board inspection apparatus configured to perform electrical inspection of wiring patterns formed on a circuit board with a built-in electronic component is provided with a plurality of contactors, a switching circuit, and a controller. The controlling device applies voltage by using a power supply between a contactor and a contactor in a state a switch of the switching circuit is set to be ON and inspects an insulating state between two wiring patterns corresponding to two inspection points on the circuit board. At this time, if forward bias is applied to and forward current flows in diodes inserted between the contactors outside the circuit board, a potential difference between the contactors becomes equal to a potential difference between the diodes and is limited to a relatively small value.

Abstract: There is provided a circuit board inspection tool configured to electrically connect a circuit board with a built-in electronic component and a circuit board inspection apparatus configured to inspect a plurality of wiring patterns formed on the circuit board. The circuit board inspection tool includes a plurality of contactors, an electrode body on which the respective contactors abut at the other end and which are electrically connected to the circuit board inspection apparatus, and a holding body having an inspection-side holding unit configured to guide one ends of the contactors to the inspection points and an electrode-side holding unit configured to guide the other ends thereof to the electrode units, wherein an amount of projection of a contactor which abuts on an inspection point of a wiring pattern conductively connected to the electronic component is formed to be greater than that of the other contactors.

Abstract: Provided is a micro contact element which is capable of coping with the miniaturization and greater complexity of substrates or boards, which is simplified due to a reduction in the number of components, and which creates sufficient contact pressure and stroke. Also provided is an inspection jig using this contact element. An inspection contact element having the contact pressure and amount of contraction required to carry out an inspection is formed by using notch parts respectively formed in two conductive cylindrical members having different outer and inner diameters so that the notch parts can function as elastic parts, and combining the two cylindrical members in such a way that the elastic parts are arranged in parallel or in series.

Abstract: An apparatus and method for securing a substantially circular wafer uses a chuck having a plurality of tensioning grooves each having at least one arcuate bend having a bend radius substantially less than an outer region radius, and a vacuum source interconnected with each of the grooves. When the wafer is placed upon the surface concentric with the chuck center and the vacuum source applied to the grooves, the wafer is held securely to the surface without distortion.

Abstract: A flameless heater apparatus and method whose heating capacity and performance can be selected and tuned at the time of manufacture, and which is easily used and has a long shelf life. The apparatus and method may be used in flameless ration heaters, such as may be used in military or emergency situations. There is provided a flameless heating method and apparatus in which the solid reactive ingredients (not including liquid reactant, typically water) are not all blended or mixed together at the time of apparatus fabrication. Rather, at least one key ingredient (typically a super-corroding alloy of magnesium and iron) in a dry powder form is kept physically segregated from all the other ingredients, such as catalysts (normally acids such as acetic or tartaric acid or acidic mixtures) and surfactants. The exothermic chemical reaction is initiated only after at least one (typically a dry powder catalyst) goes into aqueous solution after the application of water (saline or non-saline).

Abstract: Provided is a connection terminal that maintains an approximately circular shape before or after a cylindrical part is fixed by resistance welding. The connection terminal used for a connection jig interconnecting target points includes a small-diameter conductive part and a large-diameter cylindrical part disposed to surround the small-diameter conductive part. The small-diameter conductive part has a front end protruding from a front end of the large-diameter cylindrical part. A part of the small-diameter conductive part is joined to a part of the large-diameter cylindrical part. A cutout part is formed in a part of a strip portion around an axis of the cylindrical part that at least includes the portion of the large-diameter cylindrical part which is joined to the small-diameter conductive part.