Abstract: A sampling circuit and a sampling method are provided, where the sampling circuit includes a first delay chain, a second delay chain, and a half-speed binary-phase detector. The first delay chain is used to delay an input signal according to an up signal and a down signal, so as to generate a first delay signal; and the second delay chain is used to delay the first delay signal according to a preset delay value, so as to generate a second delay signal. The half-speed binary-phase detector is used to sample a data signal according to edge trigger of the first delay signal and that of the second delay signal, and generate an output signal, an up signal, and a down signal according to a sampling result of the data signal.