Patents Assigned to Renesas Semiconductor Engineering Corporation
  • Apparatus and method for testing semiconductor integrated circuit
    Patent number: 6900627
    Abstract: A test ancillary device with data memory and an analysis section is disposed in the vicinity of a test circuit board. The data memory is divided into two memory sections such that, when digital test data are stored in one memory section, the digital test data that have already been stored in the other memory section are loaded for analysis purpose.
    Type: Grant
    Filed: August 13, 2001
    Date of Patent: May 31, 2005
    Assignees: Renesas Technology Corp., Renesas Semiconductor Engineering Corporation
    Inventors: Hisaya Mori, Shinji Yamada, Teruhiko Funakura