Patents Assigned to Renishaw, PLC
  • ABSOLUTE ENCODER SETUP INDICATION
    Publication number: 20110173832
    Abstract: This invention relates to a method of operating an absolute encoder apparatus comprising a scale having features defining absolute position information in at least one measuring dimension, and a readhead configured to read the features. The method comprises: obtaining at least one representation of at least some of the features defining absolute position information; analysing the at least one representation to determine at least one parameter indicative of the quality of the representation; and providing an output indicative of the relative setup of the scale and readhead based at least in part on the at least one parameter.
    Type: Application
    Filed: October 27, 2009
    Publication date: July 21, 2011
    Applicant: RENISHAW PLC
    Inventors: Andrew Paul Gribble, Iain Robert Gordon-Ingram
  • SCALE TRACK
    Publication number: 20110162223
    Abstract: A metrological scale track comprising at least first and second metrological scale track strips. The at least first and second metrological scale track strips are held in a spaced apart relationship by at least one spacer. The at least one spacer is configured to be removed once the at least first and second metrological scale track strips have been secured to a substrate.
    Type: Application
    Filed: June 11, 2009
    Publication date: July 7, 2011
    Applicant: RENISHAW PLC
    Inventors: Alexander David Scott Ellin, Wesley Andrew Heawood
  • Apparatus and method of measuring workpieces
    Patent number: 7971365
    Abstract: A method and apparatus for measuring a surface using a surface sensing device mounted on a scanning head on a member of a coordinate positioning apparatus. The coordinate positioning apparatus may be operated to produce relative movement between the scanning head and the surface profile and the scanning head includes a drive for producing rotational movement of the surface sensing probe about one or more axis. The coordinate positioning apparatus is driven to provide relative movement between the member and the surface profile in a circular path and the probe head is driven to move the surface sensing device about said one or more axes, such that the surface sensing device maintains a nominally constant lead angle. The motion of the coordinate positioning apparatus and probe head is synchronous.
    Type: Grant
    Filed: March 23, 2007
    Date of Patent: July 5, 2011
    Assignee: Renishaw PLC
    Inventors: Stephen Paul Hunter, Geoffrey McFarland, Kevyn Barry Jonas, Khaled Mamour
  • Rotary encoder apparatus
    Patent number: 7969579
    Abstract: Rotary encoder apparatus is described that comprises one or more readheads and a radial scale. Each of the one or more readheads includes a light emitting portion for illuminating the radial scale and a light detecting portion for detecting interference fringes formed at a readhead analyzer plane. The readhead analyzer plane is tilted relative to the plane containing the radial scale. In a preferred embodiment, the readhead analyzer plane is tilted towards the center of rotation of the rotary encoder apparatus by the angle.
    Type: Grant
    Filed: April 25, 2007
    Date of Patent: June 28, 2011
    Assignee: Renishaw plc
    Inventor: Alan James Holloway
  • Machine tool workpiece inspection system
    Patent number: 7970488
    Abstract: A workpiece inspection system is disclosed for determining measurements of a workpiece on a machine tool. The system utilizes a measurement device which outputs data relating to the workpiece (e.g. in place of a conventional cutter). The problem of obtaining real time data relating to the position of the machine tool is overcome by recording a machine tool position data set and a measurement device data set at selected instants which are defined by a synchronization signal. The data sets are combined later in the correct relative position because the synchronization signal was used. The synchronization signal can issue from the machine tool controller, an interface, measurement device or another part of the system.
    Type: Grant
    Filed: January 6, 2005
    Date of Patent: June 28, 2011
    Assignee: Renishaw PLC
    Inventors: Tim Prestidge, John Charles Ould, David Kenneth Thomas, Andrew James Harding
  • Method of producing a rotary encoder
    Patent number: 7958620
    Abstract: A method of determining the eccentricity of an encoder scale member of a rotary encoder includes taking an encoder scale blank having a geometric center and mounting the encoder scale blank centered about a second center. A scale can then be produced on the encoder scale blank thereby forming an encoder scale member. The scale of the encoder scale member is centered about the second center. Any eccentricity between the geometric center and the second center is measured by, for example, measuring any change in the apparent radius of the encoder scale member. The encoder scale member may then be mounted in a working location wherein it is rotated about a third axis. The eccentricity when mounted in the working location may be matched to that measured during manufacture thereof and/or the eccentricity errors arising from both manufacture and mounting of the encoder scale member may be determined.
    Type: Grant
    Filed: April 25, 2006
    Date of Patent: June 14, 2011
    Assignee: Renishaw PLC
    Inventor: James Reynolds Henshaw
  • Method for scanning the surface of a workpiece
    Patent number: 7908759
    Abstract: A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised.
    Type: Grant
    Filed: April 19, 2006
    Date of Patent: March 22, 2011
    Assignee: Renishaw PLC
    Inventors: Ian William McLean, Nicholas John Weston, Martin Simon Rees, Leo Christopher Somerville
  • Articulating probe head apparatus and method
    Publication number: 20110061253
    Abstract: Apparatus for a co-ordinate positioning machine is described that comprises an articulating probe head for supporting a measurement probe. The articulating probe head comprises at least one electric motor. Heating means are provided for generating heat in the articulating probe head. The heating means may be the motors or discrete heating elements. Temperature sensing means, such as one or more temperature sensors, is also provided for determining the temperature at the articulating probe head. The apparatus allows the temperature of the articulating probe head to be controlled.
    Type: Application
    Filed: November 12, 2010
    Publication date: March 17, 2011
    Applicant: RENISHAW PLC
    Inventors: Kevyn Barry Jonas, Geoffrey McFarland, Nicholas John Weston, Colin Ray Bulled
  • OPTICAL INSPECTION PROBE
    Publication number: 20110058159
    Abstract: An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an illumination assembly for producing a light beam directed toward the object. The optical inspection probe is configured such that the light beam converges to a focal point at a first focal plane.
    Type: Application
    Filed: May 19, 2009
    Publication date: March 10, 2011
    Applicant: RENISHAW PLC
    Inventors: Nicholas John Weston, Alexander David McKendrick
  • APPARATUS AND METHOD FOR ELECTRONIC CIRCUIT MANUFACTURE
    Publication number: 20110056074
    Abstract: An apparatus and method are described for use in the manufacture of non-planar circuit modules. The apparatus includes a holder for holding a non-planar circuit module, an activation source for activating one or more localised regions of a non-planar circuit module held by the holder, and positioning apparatus for providing relative movement between the activation source and a non-planar circuit module held by the holder. The relative movement between the activation source and a non-planar circuit module held by the holder includes translational movement along at least one axis and rotational movement about at least one axis. A parallel positioning machine may provide such relative movement.
    Type: Application
    Filed: March 17, 2009
    Publication date: March 10, 2011
    Applicant: RENISHAW PLC
    Inventors: Kevyn Barry Jonas, Geoffrey McFarland
  • Differential calibration
    Patent number: 7900367
    Abstract: A method of calibrating a measurement probe (10) mounted on a machine is described. The measurement probe (10) has a stylus (14) with a workpiece contacting tip (16). The method comprises determining a probe calibration matrix that relates the probe outputs (a,b,c) to the machine coordinate system (x,y,z.). The method comprising the steps of scanning a calibration artefact (18) using a first probe deflection (d1) to obtain first machine data and using a second probe deflection (d2) to obtain second machine data. The first and second machine data are used to obtain a pure probe calibration matrix in which any machine errors are substantially omitted. Advantageously, the method determines the pure probe matrix numerically based on the assumption that the difference between the first and second machine position data is known.
    Type: Grant
    Filed: April 24, 2007
    Date of Patent: March 8, 2011
    Assignee: Renishaw PLC
    Inventor: Alexander Tennant Sutherland
  • Surface sensing device with optical sensor
    Publication number: 20110043827
    Abstract: A surface sensing device for use in position determining apparatus has an elongate stylus with a tip for scanning the surface of a workpiece to be measured. Lateral displacements of the stylus tip are detected by a light beam which passes along the stylus from a light source to a retroreflector. This reflects the beam back via a beamsplitter to a position sensitive detector. The stylus is mounted for longitudinal displacement on a carriage. The longitudinal displacement is measured by another light beam projected by the beamsplitter onto a second position sensitive detector.
    Type: Application
    Filed: October 26, 2010
    Publication date: February 24, 2011
    Applicant: RENISHAW PLC
    Inventors: Geoffrey McFarland, Kevyn Barry Jonas
  • Contact sensing probe
    Patent number: 7891109
    Abstract: Contact sensing probe apparatus includes a workpiece contacting stylus, a transducer mechanically coupled to the stylus and an oscillator for supplying an alternating current to the transducer to induce vibration of the stylus. A contact sensor is also provided for monitoring the phase difference between the voltage supplied to the transducer and the current flow to the transducer. The oscillator is arranged to supply the transducer with an alternating current of a first frequency during contact sensing. This first frequency is selected to induce mechanical resonance but to be away from the maximum of the mechanical resonance peak. The probe may be used with co-ordinate positioning machines, such as portable articulated measuring arms, co-ordinate measuring machines (CMM) and the like.
    Type: Grant
    Filed: May 8, 2007
    Date of Patent: February 22, 2011
    Assignee: Renishaw PLC
    Inventors: Nicholas John Weston, James Fergus Robertson
  • Method for measuring a workpiece using a machine tool
    Patent number: 7886453
    Abstract: A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.
    Type: Grant
    Filed: December 11, 2007
    Date of Patent: February 15, 2011
    Assignee: Renishaw PLC
    Inventors: John Charles Ould, Kevin James Tett
  • Probe calibration
    Patent number: 7885777
    Abstract: A method of calibrating a probe is disclosed said probe being mounted on a machine and having a stylus with a workpiece contacting tip, comprising calculating calibration information for the probe for a first orientation of the probe, and rotating the calibration information by an angle to obtain a probe calibration information for when the probe is oriented by that angle with respect to the first orientation. Also disclosed is a method of calibrating a probe during a measurement process. The calibration information may include a vector which relates probe head axes to machine axes; a calibration matrix; datum data; an inertial matrix. The stylus tip may be datumed at the orientation of the probe or inferred from datum information obtained at different orientations. The rotation step may be carried out by a software/computer program which may be stored on a controller for the machine.
    Type: Grant
    Filed: April 25, 2006
    Date of Patent: February 8, 2011
    Assignee: Renishaw PLC
    Inventors: Kevyn Barry Jonas, Jean-Louis Grzesiak, Geoffrey McFarland
  • METROLOGICAL SCALE
    Publication number: 20110024022
    Abstract: A method of applying a marking onto a metrological scale. The method comprises locating one or more markings on the scale substrate in a provisional state; checking whether the one or more markings located on the scale substrate are acceptable; and finalising the one or markings which are acceptable so as to transform the one or more markings into a finalised state.
    Type: Application
    Filed: April 21, 2009
    Publication date: February 3, 2011
    Applicant: RENISHAW PLC
    Inventors: Marcus Ardron, Richard John Hoodless, David Jonathan Walshaw
  • MODULE OR TOOL CHANGING FOR METROLOGICAL PROBE
    Publication number: 20110016995
    Abstract: Apparatus is disclosed for changing task modules or styli of a metrological probe. In one embodiment, a stylus module (18) is retained magnetically on a retaining module (16) of the probe. A horizontal pin (38) extends from a storage device (32) and engages in an aperture (40) in the stylus module (18). This allows the stylus module to be separated by a vertical movement of the retaining module. To control tilting of the stylus module relative to the retaining module, the pin (38) extends up to or beyond the resultant vector of the magnetic coupling force between the stylus module and the retaining module, which in this embodiment is along the centre line (42) of the stylus module.
    Type: Application
    Filed: September 15, 2008
    Publication date: January 27, 2011
    Applicant: RENISHAW PLC
    Inventors: David R. McMurtry, Geoffrey McFarland
  • MAGNETIC RESONANCE APPARATUS AND METHOD
    Publication number: 20110006771
    Abstract: Magnetic resonance apparatus, e.g. for magnetic resonance imaging, is described that includes a cooler unit and one or more radio-frequency (RF) coil assemblies. A separable thermal connection is provided between the cooler unit and the one or more RF coil assemblies. This separable thermal connection allows the one or more RF coil assemblies to be detached from the cooler unit after the one or more coil assemblies have been cooled to the required operating temperature. Each RF coil assembly can then be used for magnetic resonance imaging or the like. A plurality of different RF coil assemblies may thus be cooled by a single cooler unit.
    Type: Application
    Filed: February 3, 2009
    Publication date: January 13, 2011
    Applicants: RENISHAW PLC, PULSETEQ LIMITED
    Inventors: Christopher Paul Randell, Andrew Mark Woolfrey
  • Machine tool method
    Patent number: 7869899
    Abstract: Apparatus and method for fitting a workpiece to geometric design data of a workpiece. Nominal data points are selected from the geometric design data. Command codes are created to generate measured data points. The measurement data points have associated nominal measurement points which are used to fit the workpiece to the geometric design data. The apparatus and method may also be used to determine whether a workpiece is within tolerance and for process control.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: January 11, 2011
    Assignee: Renishaw PLC
    Inventors: Peter Russell Hammond, Anthony Brown
  • Calibration method and apparatus
    Patent number: 7866056
    Abstract: A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe.
    Type: Grant
    Filed: February 18, 2008
    Date of Patent: January 11, 2011
    Assignee: Renishaw PLC
    Inventors: John Charles Ould, Alexander Tennant Sutherland