Patents Assigned to Rensseleaer Polytechnic Institute
  • Publication number: 20050243412
    Abstract: An optical system is provided for creating a mosaic image of a large field of view through a microscope at fast refresh rates of about 25 Hz with a high resolution that is free of blurring or aberrations. The optical system includes an objective lens assembly (20), an iris (30), one or more scanning mirrors (40) for high-speed scanning, one or more imaging lenses and irises (50, 60, 80), and a high-speed imaging device (70) arranged in that order from an object. The optical system also includes a mechanism for processing and constructing scanned and captured images into a mosaic image.
    Type: Application
    Filed: September 15, 2003
    Publication date: November 3, 2005
    Applicant: Rensseleaer Polytechnic Institute
    Inventors: Yves Bellouard, Benjamin Postsaid
  • Patent number: 5351697
    Abstract: A method for obtaining sets of current patterns for three-dimensionally imaging the interior of a body having an internal resistivity using electrical impedance tomography comprises providing an array of electrodes arranged in a plurality of groups for an impedance imaging system. A linearly independent set of current patterns is also established for forming a basis for each group. A constant pattern is then adjoined to each basis for forming an augmented basis for each group. A tensor product is then taken of the augmented basis for forming a tensor product basis. Finally, the constant pattern from the tensor product basis is removed in order to establish a basis of current patterns for being applied to the array of electrodes.
    Type: Grant
    Filed: September 29, 1993
    Date of Patent: October 4, 1994
    Assignee: Rensseleaer Polytechnic Institute
    Inventors: Margaret Cheney, David Isaacson