Abstract: A method for high resolution photoacoustic imaging in scattering media using structured illumination may include illuminating a sample of an absorption object with structured illumination, including illuminating the sample with multiple different speckle patterns at different times. The method may also include detecting multiple photoacoustic signals generated by the absorption object in response to illumination with the different speckle patterns to generate multiple photoacoustic responses. The method may also include reconstructing an absorber distribution of the absorption object by exploiting joint sparsity of sound sources in the plurality of photoacoustic responses.

Abstract: A method for laser-optical detection of a surface movement of a sample (1) is specified, whereby a first laser reference beam (10) is superimposed with a first laser measurement beam (12) directed onto the sample (1) and reflected by the latter in a first photorefractive/electro-optical element (4). In addition, a second reference beam (11) identical to the first reference beam (10) is superimposed with a second measurement beam (13) identical to the first measurement beam (12) in a second photorefractive/electro-optical element (5). Mutually inverse voltages are applied to the two photorefractive/electro-optical elements (4, 5). The light emerging from the photorefractive/electro-optical elements (4, 5) is converted into electric signals which are subtracted from one another prior to the signal evaluation. Also specified is an arrangement for implementing said method.

Abstract: A method and a device for monitoring a property of a coating of a solid dosage form during a coating process forming the coating of the solid dosage form are provided. The device comprises a coating apparatus configured for forming the coating on the solid dosage form, and a monitoring apparatus configured for monitoring the property of the coating of the solid dosage form in process, wherein at least a part of the monitoring apparatus is located so as to have insight in an interior of the coating apparatus, the interior accommodating the solid dosage form to be coated and a precursor for forming the coating, and wherein the monitoring apparatus is configured for monitoring the property of the coating of the solid dosage form simultaneously with and during a coating process using low coherence interferometry.

Abstract: A method for laser-optical detection of a surface movement of a sample (1) is specified, whereby a first laser reference beam (10) is superimposed with a first laser measurement beam (12) directed onto the sample (1) and reflected by the latter in a first photorefractive/electro-optical element (4). In addition, a second reference beam (11) identical to the first reference beam (10) is superimposed with a second measurement beam (13) identical to the first measurement beam (12) in a second photorefractive/electro-optical element (5). Mutually inverse voltages are applied to the two photorefractive/electro-optical elements (4, 5). The light emerging from the photorefractive/electro-optical elements (4, 5) is converted into electric signals which are subtracted from one another prior to the signal evaluation. Also specified is an arrangement for implementing said method.

Abstract: A method and a device for monitoring a property of a coating of a solid dosage form during a coating process forming the coating of the solid dosage form are provided. The device comprises a coating apparatus configured for forming the coating on the solid dosage form, and a monitoring apparatus configured for monitoring the property of the coating of the solid dosage form in process, wherein at least a part of the monitoring apparatus is located so as to have insight in an interior of the coating apparatus, the interior accommodating the solid dosage form to be coated and a precursor for forming the coating, and wherein the monitoring apparatus is configured for monitoring the property of the coating of the solid dosage form simultaneously with and during a coating process using low coherence interferometry.