Patents Assigned to Research Technology International
  • Patent number: 5461481
    Abstract: A system, apparatus and/or method for detecting and analyzing light intensities of reflected light from a surface of /a specimen, preferably a web, wherein light is directed onto the surface of the specimen, light reflected from the surface is detected by an array of photosensitive elements, and a signal generated by the array is analyzed to identify reflected light intensities that exceed at least one threshold for a sufficient number of photosensitive elements to warrant classification as indicative of a sufficiently pronounced change in the angularity or reflectance in the surface of the specimen. In particular, the pronounced change can be identified as a defect, for example, a crease, in the specimen surface. Preferably, the array is a CCD array. Preferably, the specimen is a video tape.
    Type: Grant
    Filed: December 29, 1992
    Date of Patent: October 24, 1995
    Assignee: Research Technology International Company
    Inventors: Howard Bowen, John S. Little
  • Patent number: 4687943
    Abstract: A motion picture film flaw detection system wherein a single inspection location is employed at which sound track side edge defects, sprocket hole side edge defects, thickness variations, and defective sprocket holes are analyzed by optical sensors so that no physical contact on the film by feeler arms or the like occurs. Film wear such as by scratching and rubbing is reduced since minimal contact occurs with a surface of the film as it travels through the system. The sprocket holes are analyzed by optics which provide a real image on a projection plane at which location excessive elongation of the sprocket holes is checked. Detection circuits are provided connecting to the optical sensors which derive a reference which automatically tracks averaged or weighted overall signal levels for comparison to signal variations caused by film thickness changes or film flaws. Accordingly, variations in optical system performance are automatically compensated for.
    Type: Grant
    Filed: January 18, 1985
    Date of Patent: August 18, 1987
    Assignee: Research Technology International
    Inventors: Howard Bowen, David Henderson, Carl Olson
  • Patent number: 4652125
    Abstract: A motion picture film flaw detection system wherein a single inspection location is employed at which sound track side edge defects, sprocket hole side edge deflects, thickness variations, and defective sprocket holes are analyzed by optical sensors so that no physical contact on the film by feeler arms or the like occurs. Film wear such as by scratching and rubbing is reduced since minimal contact occurs with a surface of the film as it travels through the system. The sprocket holes are analyzed by optics which provide a real image on a projection plane at which location excessive elongation of the sprocket holes is checked. Detection circuits are provided connecting to the optical sensors which derive a reference which automatically tracks averaged or weighted overall signal levels for comparison to signal variations caused by film thickness changes or film flaws. Accordingly, variations in optical system performance are automatically compensated for.
    Type: Grant
    Filed: January 18, 1985
    Date of Patent: March 24, 1987
    Assignee: Research Technology International
    Inventors: Howard Bowen, David Henderson, Carl Olson
  • Patent number: 4652124
    Abstract: A motion picture film flaw detection system wherein a single inspection location is employed at which sound track side edge defects, sprocket hole side edge defects, thickness variations, and defective sprocket holes are analyzed by optical sensors so that no physical contact on the film by feeler arms or the like occurs. Film wear such as by scratching and rubbing is reduced since minimal contact occurs with a surface of the film as it travels through the system. The sprocket holes are analyzed by optics which provide a real image on a projection plane at which location excessive elongation of the sprocket holes is checked. Detection circuits are provided connecting to the optical sensors which derive a reference which automatically tracks averaged or weighted overall signal levels for comparison to signal variations caused by film thickness changes or film flaws. Accordingly, variations in optical system performance are automatically compensated for.
    Type: Grant
    Filed: January 18, 1985
    Date of Patent: March 24, 1987
    Assignee: Research Technology International
    Inventors: Howard Bowen, David Henderson, Carl Olson