Patents Assigned to Research Technology International Company
  • Patent number: 5461481
    Abstract: A system, apparatus and/or method for detecting and analyzing light intensities of reflected light from a surface of /a specimen, preferably a web, wherein light is directed onto the surface of the specimen, light reflected from the surface is detected by an array of photosensitive elements, and a signal generated by the array is analyzed to identify reflected light intensities that exceed at least one threshold for a sufficient number of photosensitive elements to warrant classification as indicative of a sufficiently pronounced change in the angularity or reflectance in the surface of the specimen. In particular, the pronounced change can be identified as a defect, for example, a crease, in the specimen surface. Preferably, the array is a CCD array. Preferably, the specimen is a video tape.
    Type: Grant
    Filed: December 29, 1992
    Date of Patent: October 24, 1995
    Assignee: Research Technology International Company
    Inventors: Howard Bowen, John S. Little