Patents Assigned to Revise, Inc.
  • Patent number: 6033721
    Abstract: Apparatus for determining a best trajectory for laser CVD through a strategy of acquiring a series of two-dimensional plane images of the substrate. These images, taken together, contain topographical information as well as local reflectivity and thermal mapping information. The images are combined in digital format with additional substrate mapping information to calculate a best three-dimensional trajectory for the desired laser operation. The technique is especially suitable for compensation of tilt or severe height variation on microelectronic parts. The apparatus can deposit platinum conductors on integrated circuits by pyrolytic deposition from Pt(PF.sub.3).sub.4 vapor.
    Type: Grant
    Filed: October 26, 1994
    Date of Patent: March 7, 2000
    Assignee: Revise, Inc.
    Inventor: Nikos Nassuphis
  • Patent number: 5874011
    Abstract: Techniques and apparatus for the laser induced etching of a reactive material, or of a multilayer substrate or wafer comprising layers of materials of different etching characteristics and reactivities, are disclosed. Short wavelength laser radiation and control of the process ambient equalize etch rates of the layers of a multilayer substrate or wafer and allow high-resolution etching. A suppressant gas introduced into a halogen-containing ambient suppresses explosive reactions between the ambient and reactive materials or layers. For less reactive layers or materials, reduced-pressure air is a suitable ambient. The techniques and apparatus disclosed herein are particularly useful in the manufacture of magnetic data transfer heads.
    Type: Grant
    Filed: August 1, 1996
    Date of Patent: February 23, 1999
    Assignee: Revise, Inc.
    Inventor: Daniel Ehrlich