Patents Assigned to Rheinmetall Jenoptik Optical Metrology GmbH
  • Patent number: 5627585
    Abstract: An arrangement for high-resolution scanning of large image formats with exact geometrical correspondence is described. It is applied in photogrammetry and in optoelectronic scanners with high requirements regarding exact geometrical correspondence. Metric image contractions of large image formats are obtained without dimension-embodying auxiliary means by employing a CCD matrix which is exactly dimensioned to pixel sensitivity distribution. This CCD matrix is used as an absolute dimensional embodiment, from which only one active pixel area determined as a function of the memory area of the frame grabber is adopted into the frame grabber while ensuring an image contraction which is absolutely synchronous with the pixels.
    Type: Grant
    Filed: July 19, 1996
    Date of Patent: May 6, 1997
    Assignee: Rheinmetall Jenoptik Optical Metrology GmbH
    Inventors: Ralf Goldschmidt, Werner Borchardt