Patents Assigned to Rigaku Innovative Technology
  • Patent number: 7848483
    Abstract: The present invention provides a multilayer structure including a substrate having formed on a surface thereof at least one period of individual layers, the period having at least two layers including a first layer which includes magnesium silicide and a second layer which includes at least one of tungsten, tantalum, cobalt, nickel, copper, iron, chromium, alloys, oxides, borides, silicides, and nitrides of these elements, silicon, carbon, silicon carbide, boron, and boron carbide. If the period includes three layers, the second layer includes one of silicon, carbon, silicon carbide, boron, and boron carbide and a third layer includes one of tungsten, tantalum, cobalt, nickel, copper, iron, chromium, and alloys, oxides, borides, silicides, and nitrides of these elements, the second layer being disposed between the first and the third layers.
    Type: Grant
    Filed: August 5, 2008
    Date of Patent: December 7, 2010
    Assignees: Rigaku Innovative Technologies, Rigaku Industrial Corporation
    Inventors: Yuriy Y. Platonov, Kazuaki Shimizu
  • Patent number: 7734011
    Abstract: A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.
    Type: Grant
    Filed: November 30, 2007
    Date of Patent: June 8, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Licai Jiang
  • Patent number: 7720197
    Abstract: An x-ray optical system for producing high intensity x-ray beams. The system includes an optic with a surface formed by revolving a defined contour around a revolving axis that is different than the geometric symmetric axis of the optic. Accordingly, the system may use a source that has a circular emission profile or a large source to provide increased flux to a sample.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: May 18, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Licai Jiang
  • Patent number: 7706503
    Abstract: An x-ray optical device delivers an x-ray beam with variable convergence. The convergence or the divergence of the x-ray beams varies over different parts of the reflector. The device may include an adjustable aperture to further select the convergence or divergence. The adjustable aperture selects the convergence angle by selectively occluding a portion of the x-ray beams.
    Type: Grant
    Filed: November 20, 2007
    Date of Patent: April 27, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Licai Jiang
  • Patent number: 7684545
    Abstract: The system includes a conductive window, a spectrum changing layer, a fiber optic bundle, a camera sensor, and a power supply. The spectrum changing layer is excited by the x-rays and emits a different wavelength of light, such as visible light. The fiber optic bundle receives the visible light from the spectrum changing material and transmits the visible light to the camera sensor. The camera sensor detects the light emitted from the spectrum changing layer and converts the information to electronic signals. The camera sensor is cooled by a cooling device, as such thermal conduction may cool the fiber optic bundle. To avoid condensation, current may flow through the conductive window thereby heating the conductive window.
    Type: Grant
    Filed: October 30, 2007
    Date of Patent: March 23, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventors: Michael A. Damento, Hugh F. Garvey
  • Patent number: 7651270
    Abstract: A system for x-ray optical alignment. The system includes an x-ray source, an optic, a collimation element, and alignment sensors. The x-ray source generates an x-ray beam that is directed by the optic at a sample. The collimation element is located between the optic and the sample to define the profile of the x-ray beam. The sensors receive the x-ray beam from the optic and generated signal indicative of the system alignment. The sensors may be located on a surface of the collimation element facing the optic. The inner edge of the sensors may be located at equal intervals radially about the collimation element and may form an aperture having a symmetric shape.
    Type: Grant
    Filed: August 31, 2007
    Date of Patent: January 26, 2010
    Assignee: Rigaku Innovative Technologies, Inc.
    Inventor: Bonglea Kim