Abstract: A method for measuring group delay on a device under test is described, wherein a test signal with a carrier frequency is generated. An amplitude modulation is applied to said test signal in order to generate at least two group delay signals having frequencies that are symmetrical to the frequency of said test signal. At least said group delay signals are provided to said device under test. Further, a measurement device and a measurement system are described.

Abstract: A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (Sm) from different calibration standards (3) and with associated actual scattering parameters (Sa) of the calibration standards (3) and determines linear-in-T system errors (Ti) for the calibration of a network analyzer (1) by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k, p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error (Ti) or with a correct second linear-in-T system error pkor(k)) dependent upon the first linear-in-T system error (k).

Abstract: A measuring device comprises a microwave transmitter, a microwave receiver, at least one antenna, a control device and a dielectric extension. The dielectric extension is disposed between the antenna and an object to be investigated. The control device controls the microwave transmitter and the microwave receiver. The microwave transmitter transmits a microwave signal by means of the antenna and the dielectric extension into the object to be investigated. The object to be investigated scatters the microwave signal. The microwave receiver receives the scattered microwave signal by means of the antenna and the dielectric extension. The length and the dielectric constant of the dielectric extension in this context are dimensioned in such a manner that the object to be investigated is disposed in the remote field of the antenna.

Abstract: The present invention provides an amplifier circuit for amplifying an incoming signal, the amplifier circuit comprising at least two signal paths configured to amplify signals of different overlapping frequency bands, a signal splitter comprising an input port configured to receive the incoming signal, the signal splitter being coupled to an input side of the signal paths and configured to split the incoming signal into split signals for the signal paths, and a diplexer coupled to an output side of the signal paths and configured to combine the amplified signals and provide a combined amplified signal. Further, the present invention provides a respective method.

Abstract: An instrument is described which comprises an input for receiving a signal, a data processing unit for analyzing said received signal and providing data to be displayed, and a touch enabled display screen for displaying said data to be displayed and receiving commands directed to said data processing unit. Said commands comprise commands that determine how said data is displayed on the touch enabled display screen and commands that determine operations that are performed by said instrument and/or said data processing unit. Said commands are specified by control gestures on said touch enabled display screen. Said control gestures are unambiguously related to certain commands. Said data processing unit recognizes said control gestures wherein said data processing unit is configured to determine a corresponding command specified by said detected control gesture and to process said determined command. Said instrument is a test instrument for measuring and/or analyzing said received signal.

Abstract: A measurement system is described, comprising a signal processing equipment, an antenna unit, a device under test, and a resonant cavity surrounding the antenna unit and the device under test. The signal processing equipment is at least one of a signal generation equipment and a signal measurement equipment. The resonant cavity has a resonance for a frequency corresponding to at least one of the frequency used for testing the device under test and its multiples. The device under test is located within the resonant cavity such that a standing wave is established inside the resonant cavity during testing the device under test. The standing wave has an electric field distribution with maxima and minima. The antenna unit is located within the resonant cavity such that the antenna unit is assigned to a maximum of the electric field. Further, a method for testing a device under test is described.

Abstract: A measurement device for measuring the impedance of a device under test is described. Said measurement device comprises at least one signal generator for generating a signal with a certain frequency wherein said signal is used for testing said device under test. Said measurement device further has at least one shunt resistor that is used for determining the electric current of said signal. Said device also comprise at least two voltage channels for measuring the voltage across said device under test. Said measurement device is an oscilloscope having at least four voltage inputs and wherein said measurement device is configured to derive the impedance of said device from said electric current and said voltage. Further, a method for measuring the impedance of a device under test is described.

Abstract: A test and measurement device is described that includes a radio frequency input for receiving a radio frequency signal, a mixer to mix the radio frequency signal into a first intermediate frequency signal, a splitter to split the first intermediate frequency signal into several split signals, several signal paths for processing the several split signals, and a recombiner that is configured to recombine the split signals in order to create an output signal having a frequency span substantially representing the one of the radio frequency signal. Further, a method for calibrating a test and measurement device and a method for analyzing a high bandwidth of a radio frequency signal are described.

Abstract: A measurement system for testing a device under test is described, with at least two antennas, at least two reflectors, a signal generation and/or analysis equipment and a test location. Each of the antennas is assigned to a corresponding reflector. Each of the antennas is configured to transmit/receive an electromagnetic signal so that a beam path is provided between the respective antenna and the test location. The electromagnetic signal is reflected by the respective reflector so that the electromagnetic signal corresponds to a planar wave. The beam paths have different angular orientations that are adjustable. At least one antenna and the corresponding reflector are coupled with each other so that an integrated beam path adjustment unit is established including at least one antenna and the corresponding reflector. Further, a testing method is described.

Abstract: Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

Abstract: An approach for the analysis of the impact of over the top (OTT) applications is provided, which operate “over the top” of the network applications, with respect to network performance and power consumption on mobile devices. A wireless network for an application-carrying device separate from wireless communications network test equipment is simulated. A wireless communications interface between the simulated network and the application-carrying device is monitored. The monitoring comprises measuring signaling data on a control plane, and measuring application data on a user plane related to at least one application implemented on the application-carrying device. Cross-layer measurement data is generated based on the measured signaling data and application data. The signaling data and the application data are measured on the basis of a common time reference of the test equipment.

Abstract: The printed circuit board with at least one substrate layer having signal lines on a corresponding upper surface and on a corresponding lower surface has a sleeve-sized conductive layer on a circumference of at least one via hole between the upper and lower surface for a conductive connection between at least one signal line on the upper surface and at least one signal line on the lower surface. An axial enlargement of the sleeve-sized conductive layer is radially bent above a base layer of copper on the upper surface and below a base layer of copper on the lower surface.

Abstract: A channel sounding testing device is provided. The channel sounding testing device comprises a processor configured to use channel models and scenario specific propagation parameters, which are verified by comparable channel measurements in representative environments, to perform testing operations.

Abstract: A system for determining the radiation pattern of an antenna array comprising a plurality of antenna elements comprises a signal generator for generating a test signal, a number of probes for measuring a magnitude of the signals emitted by the antenna elements when driven with the test signal in a first surface and in a second surface, wherein the distance of the first surface to the antenna elements is smaller than the distance of the second surface to the antenna elements, and a pattern calculation unit for calculating the radiation pattern of the antenna array based on the magnitudes measured in the first surface and the second surface.

Abstract: A method for calibrating a radio frequency test instrument is described wherein a first frequency response is measured using a radio frequency and coarse intermediate frequency grid. A first matrix is created comprising data obtained from said first frequency response measuring. A second frequency response is measured using a radio frequency and fine intermediate frequency grid. A second matrix is created comprising data obtained from said second frequency response measuring. Said first matrix and said second matrix are processed and combined in order to determine a frequency response for a radio frequency desired, said first matrix and said second matrix comprising data obtained from measurements performed with different radio frequency and intermediate frequency grids. Further, a radio frequency test instrument is described.

Abstract: The present invention provides to an estimation of a directed signal on a bidirectional duplex transmission line without the need of a directional coupler which has to be physically inserted into the wired transmission line. It is for this purpose, that the signals on the transmission line are measured at two separate spatial positions and the directed signals on the wired transmission line are estimated by analyzing the measured signals.

Abstract: An optoelectronic circuit for transmitting an optical clock signal to an electronic component contains a clock-generating device for the generation of an optical clock signal, a converter element for the conversion of the optical clock signal into an electrical clock signal supplied to the electronic component and an optical line from the clock-generating device to the conversion element. The optoelectronic circuit in this context provides a delay time of the optical clock signal from the clock-generating device to the conversion element. The optoelectronic circuit accordingly comprises an adjustable optical element for adjusting the delay time between the clock-generating device and the electronic component.

Abstract: A measurement system comprising a measurement device and at least a first probe unit and a second probe unit is disclosed. The first probe unit and the second probe unit are each connected to the measurement device in a signal transmitting manner. At least one of the measurement device and the first probe unit comprises a control unit. The first probe unit comprises an interface module being configured to generate an input data signal and to provide the input data signal to the control unit. The control unit is configured to generate and provide a control signal at least to the second probe unit based on the input data signal. Moreover, a method for operating a measurement system is disclosed.

Abstract: A measurement system comprising a device under test, at least a first antenna and a second antenna, a reflector device, a shielded space and a signal analysis module is disclosed. The first antenna is configured to at least one of generate electromagnetic waves directed to the reflector device and receive electromagnetic waves reflected by the reflector device. The reflector device is configured to reflect electromagnetic waves between the first antenna and the device under test. The second antenna is positioned in a near-field area of the device under test. At least the second antenna is connected to the signal analysis module, and the device under test, the first antenna, the second antenna and the reflector device are assigned to the shielded space. Moreover, a method for operating a measurement system is disclosed.