Abstract: A measurement system includes an input port, a signal splitter, first and second signal paths, an analysis circuit, and a control circuit. The input port is configured to receive an input signal to be measured. The signal splitter is configured to split the input signal into a first signal that is forwarded to the first signal path and a second signal that is forwarded to the second signal path. The analysis circuit is connected to the first signal path and the second signal path so as to receive both a first processed signal and a second processed signal. The analysis circuit is configured to a complex-valued product signal from the processed signals average the complex-valued product signal over a predetermined number of samples, and determine an averaged power signal based thereon. The control circuit is configured to directly or indirectly add an offset to the averaged power signal.

Abstract: A receiver equalizer circuit is described. The equalizer circuit includes a signal input, a first signal processing channel, a second signal processing channel, and a filter circuit. The first signal processing channel includes a first analog-to-digital converter and a first digital down-converter provided downstream of the first analog-to-digital converter. The second signal processing channel includes a second analog-to-digital converter and a second digital down-converter provided downstream of the second analog-to-digital converter. The filter circuit is connected to the signal processing channels downstream of the digital down-converters. Further, a transmitter equalizer circuit and an electronic device are described.

Abstract: A method for determining a condition of a quantum computer is described. The method includes the steps of: providing a quantum computing system having a cryogenic chamber with at least one quantum computing chip inside the cryogenic chamber, wherein the at least one quantum computing chip is connected to at least one cable running through the cryogenic chamber; performing a time-domain reflectometry measurement on the cable, thereby obtaining measurement data; and determining a condition of the quantum computing system based on the measurement data obtained from the time-domain reflectometry measurement.

Abstract: The application includes a test and/or measurement system having an RF signal source to generate an RF stimulus signal; a device port; a signal path connecting the RF signal source to the device port; a measurement unit coupled to the signal path to measure the RF stimulus signal propagating via the signal path to the device port and a measurement signal received at the device port. A bias tee couples to the signal path and includes a DC input port to receive a DC bias signal. The bias tee couples the DC bias signal into the signal path. The system operates in a calibration mode where at least four different calibration standards are alternately connected to the device port. The system couples the DC bias signal into the signal path during the connection of one or more of the calibration standard(s), but not with all of the calibration standards.

Abstract: A signal processing method of processing frequency domain signal data is described. The signal processing method includes at least the steps of applying, by the signal processing circuit, a first window function and a second window function to frequency domain signal data, thereby obtaining first modified signal data and second modified signal data, wherein the second window function is different from the first window function. The modified signal data can then be transformed into time domain. The signal processing circuit or other circuitry, such as a visualization circuit, may then generate joint visualization data based on the first transformed signal data and based on the second transformed signal data, wherein the joint visualization data comprises information on both the first transformed signal data and the second transformed signal data. Further, a measurement instrument is described.

Abstract: The present disclosure relates to a power sensor arrangement for on-wafer power calibration including a power sensor(s). The power sensor(s) include: a first connection surface which is arranged to receive a probe tip of a probing device; a power measurement cell which is electrically connected to the first connection surface, wherein the power measurement cell is configured to measure a power level of an RF signal applied to the first connection surface; an analog-to-digital converter (ADC) which is configured to digitalize an output signal of the power measurement cell to generate a digitalized data stream; and an encoding unit configured to encode the digitalized data stream. The encoding unit is configured to output the encoded data stream to: the first connection surface, a second connection surface of the power sensor(s), or an antenna unit of the power sensor arrangement for forwarding the encoded data stream.

Abstract: A system for booking of lab measurement devices is provided. The system comprises a user workstation and one or more lab networks being connected to the user workstation, the respective lab network of the one or more lab networks comprising a lab workstation and one or more measurement devices. The lab workstation or any one of the one or more measurement devices comprises a booking service for the one or more measurement devices of the respective lab network. The booking service comprises a discovery service for the booking service, a web interface for making bookings and a REST interface for an automated retrieval of bookings. The user workstation is configured to remotely access the booking service of the respective lab network in accordance with existing IT access rights of a user of the user workstation. This minimizes administrative burden in multi-site/lab environments.

Abstract: An optimization method of automatically optimizing a performance parameter of a signal generator circuit is described. An RF output signal is generated by the signal generator circuit. A performance parameter of the signal generator circuit is determined based on the RF output signal by the control circuit. At least one operational parameter of the signal generator circuit is adapted by the control circuit in order to optimize the performance parameter. Further, a signal generator circuit is described.

Abstract: The present disclosure relates to a method of testing light-fidelity (LiFi) coverage. A mobile light-fidelity tester is moved in a test area in which at least one indoor light-fidelity access point is located while performing coverage tests of the at least one indoor light-fidelity access point. Further, a coverage report of the at least one indoor light-fidelity access point is returned. In addition, a test system is described.

Abstract: A control apparatus for generating a control signal for an electro-optic modulator is described. The control apparatus includes an RF signal source being configured to generate a radio frequency (RF) signal. The control apparatus further includes an amplitude adjustment circuit being configured to adjust an amplitude of the RF signal, thereby obtaining an adjusted RF signal. The control apparatus further includes a DC signal source being configured to generate a direct current (DC) signal. The control apparatus further includes a superposition circuit being configured to superimpose the adjusted RF signal and the DC signal, thereby obtaining the control signal for the electro-optic modulator. The control apparatus further includes a control circuit, wherein the control circuit is configured to receive at least one frequency parameter associated with the electro-optic modulator. The at least one frequency parameter includes a frequency multiplication factor and/or a target modulation frequency.

Abstract: The present disclosure relates to a sensor system for analyzing a spectrum of an electromagnetic, EM, signal. The system includes a vapor cell containing at least one species of atoms in a gaseous form, wherein the atoms in the vapor cell are exposed to the EM signal; at least one excitation source excites a number of atoms in the vapor cell to a Rydberg state, wherein at least a fraction of the excited atoms are ionized; a number of electrode pairs which are arranged along the vapor cell, and which generate a spatially and/or temporally varying electric field in the vapor cell; a current sense circuit detects a current between at least one of the number of electrode pairs, wherein the current is caused by ionized atoms in the vapor cell; and a processor determines spectral information of the EM signal based on the detected current.

Abstract: The present disclosure relates to techniques for evaluating an electromagnetic field of a device under test.

Abstract: A measurement instrument for testing a DUT comprises a common port configured to be connectable to a signal output of the DUT for receiving a forward-travelling signal from the DUT. The measurement instrument further comprises a signal line connected to the common port, a signal analysis circuit and a signal generator circuit. The signal analysis circuit receives the forward-travelling signal from the common port. The signal analysis circuit is configured to analyze the forward-travelling signal in order to assess a performance of the DUT. The signal generator circuit is connected to the signal line and is configured to generate a backward-travelling signal that is forwarded to the common port. The signal generator circuit comprises a reference signal input configured to receive a reference signal from a reference signal generator. The signal generator circuit is configured to generate the backward-travelling signal based on the reference signal.

Abstract: A phase coherent synthesizer with good phase noise and spurious performance is described. The phase coherent synthesizer includes digital direct synthesizer (DDS) circuitry, frequency multiplier circuitry, an oscillator, and a mixing stage. The digital direct synthesizer (DDS) circuitry has a first output and a second output. The first output is associated with a fine resolution synthesis. The second output is associated with a step synthesis. A second output signal provided via the second output has a higher frequency compared with a first output signal provided via the first output. The frequency multiplier circuitry is connected with the second output. The frequency multiplier circuitry is configured to multiply the second output signal received via the second output, thereby generating a multiplied output signal. The mixing stage has two input ports connected with the frequency multiplier circuitry and the oscillator respectively.

Abstract: The present disclosure generally relates to an anechoic chamber for testing a device under test over-the-air, a system, and a method. The anechoic chamber includes at least one reflecting surface being configured to variably manipulate in a defined manner at least one reflection process of at least one electromagnetic wave usable for testing the device under test.

Abstract: A maintenance system for maintaining a hardware system is described. The maintenance system includes an acquisition circuit and an analysis circuit. The acquisition circuit can be configured to acquire a plurality of operational parameters of the hardware system, the plurality of operational parameters being relevant to a health state of the hardware system. The acquisition circuit can be configured to forward the plurality of operational parameters to the analysis circuit. The analysis circuit can be configured to determine a device health score for the hardware system, a remaining useful life of the hardware system, and/or a user recommendation for operating the hardware system, each based on the plurality of operational parameters. Further, a method of analyzing and/or creating health information for a hardware system is described.

Abstract: Disclosed is a printed circuit board, PCB, arrangement, comprising a first PCB comprising a digital integrated circuit, IC; a second PCB, comprising a power supply circuitry for the digital IC; and a plurality of electrically conductive spacers, being mechanically interposed between the first PCB and the second PCB, and electrically interposed between the power supply circuitry and the digital IC. This avoids the issues due to the increase in power density as well as integration level in cutting edge processor architecture.

Abstract: A radio frequency test or measurement device for enhancing processing speed and reducing computational effort is configured to store at least one pre-calculated configuration set with an associated first unique identifier. The device is further configured to obtain a second UID via a communication network. The device is also configured to configure the device according to the pre-calculated configuration set, if the first UID matches the second UID. The pre-calculated configuration set comprises at least one of a software configuration setting or a hardware configuration setting.

Abstract: A method and apparatus for removal of a parasitic coupling of a signal source to an output of an antenna array comprising at least one antenna element connected via an associated controllable switch to a signal receiver connected to the output of said antenna array, the method includes measuring a parasitic coupling signal received by the signal receiver connected to the output of said antenna array while all switches of the antenna array are switched off and a first reference signal received by a reference signal receiver; measuring a total reception signal for each antenna element and a second reference signal; calculating a parasitic coupling free reception signal for each antenna element by subtracting a ratio between the measured parasitic coupling signal and the measured first reference signal from a ratio between the total reception signal.

Abstract: A radar target simulator with no lower target distance limitation and continuous distance emulation is provided. Said radar target simulator comprises a receiving unit configured to receive a radar signal from a radar under test and to provide a corresponding receive signal, and a ramp slope estimating unit. In this context, the ramp slope estimating unit is configured to track the ramp slope of the radar under test on the basis of the receive signal.