Patents Assigned to Rokio, Inc.
  • Audit capabilities in pattern recognition systems
    Patent number: 10810452
    Abstract: Methods, apparatuses and systems directed to pattern identification and pattern recognition. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In some implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes.
    Type: Grant
    Filed: May 19, 2017
    Date of Patent: October 20, 2020
    Assignee: Rokio, Inc.
    Inventor: Jeffrey Brian Adams
  • Pattern recognition system
    Patent number: 10657451
    Abstract: Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.
    Type: Grant
    Filed: August 28, 2014
    Date of Patent: May 19, 2020
    Assignee: Rokio, Inc.
    Inventors: Tyson J. Thomas, Kristopher Robert Buschelman, Frank G. Evans, Karl P. Geiger, Michael P. Kelley, Eric C. Schneider, Timothy J. Carruthers, Jeffrey Brian Adams
  • Empirical data modeling
    Patent number: 9684838
    Abstract: Methods, apparatuses and systems directed to pattern identification and pattern recognition. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In some implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes.
    Type: Grant
    Filed: May 17, 2012
    Date of Patent: June 20, 2017
    Assignee: Rokio, Inc.
    Inventor: Jeffrey Brian Adams