Patents Assigned to rubitec GmbH
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Patent number: 8372378Abstract: The present invention relates to a process for the preparation of a silicate comprising at least silicon and oxygen, comprising (1) mixing of silicon dioxide and/or of a silicon dioxide precursor with an aqueous solution comprising at least one tetraalkylammonium compound comprising R1R2R3R4N+ and at least one base, wherein R1 and R2 are methyl and both R3 and R4 are n-propyl; (2) heating of the colloidal solution obtained according to (1) to a temperature in the range of from greater than the boiling point of the colloidal solution under the chosen pressure to 180° C. at atmospheric pressure to give a suspension comprising at least one silicate, wherein the silicate comprising at least silicon and oxygen is added as a crystallization auxiliary in (1).Type: GrantFiled: April 8, 2011Date of Patent: February 12, 2013Assignees: BASF SE, Rubitec GmbHInventors: Ulrich Mueller, Roger Ruetz, Hermann Gies
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Patent number: 8124560Abstract: The present invention relates to a tectosilicate having an X-ray diffraction pattern in which at least the following reflections occur: Intensity (%) Diffraction angle 2?/° [Cu K(alpha 1)] 100 ?9.8-10.2 24-34 11.0-11.4 ?9-19 15.5-15.9 12-22 19.4-19.6 19-29 19.6-19.8 100% relating to the intensity of the maximum peak in the X-ray diffraction pattern.Type: GrantFiled: October 7, 2010Date of Patent: February 28, 2012Assignees: BASF Aktiengesellschaft, rubitec GmbHInventors: Ulrich Mueller, Gerald Lippert, James Reuben Brown, Hermann Gies, Bernd Marler, Nadine Stroeter, Yingxia Wang
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Publication number: 20110182793Abstract: A sheet silicate, a framework silicate, and a process of producing the same.Type: ApplicationFiled: April 8, 2011Publication date: July 28, 2011Applicants: BASF SE, rubitec GmbHInventors: Ulrich Müller, Roger Ruetz, Hermann Gies
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Publication number: 20110135567Abstract: The present invention relates to a tectosilicate having an X-ray diffraction pattern in which at least the following reflections occur: Intensity (%) Diffraction angle 2?/° [Cu K(alpha 1)] 100 ?9.8-10.2 24-34 11.0-11.4 ?9-19 15.5-15.9 12-22 19.4-19.6 19-29 19.6-19.8 100% relating to the intensity of the maximum peak in the X-ray diffraction pattern.Type: ApplicationFiled: October 7, 2010Publication date: June 9, 2011Applicants: BASF SE, rubitec GmbHInventors: Ulrich MÜLLER, Gerald Lippert, James Reuben Brown, Hermann Gies, Bernd Marler, Nadine Ströter, Yingxia Wang
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Patent number: 7947244Abstract: The present invention relates to a process for the preparation of a silicate comprising at least silicon and oxygen, comprising (1) mixing of silicon dioxide and/or of a silicon dioxide precursor with an aqueous solution comprising at least one tetraalkylammonium compound comprising R1R2R3R4N+ and at least one base, wherein R1 and R2 are methyl and both R3 and R4 are n-propyl; (2) heating of the colloidal solution obtained according to (1) to a temperature in the range of from greater than the boiling point of the colloidal solution under the chosen pressure to 180° C. at atmospheric pressure to give a suspension comprising at least one silicate, wherein the silicate comprising at least silicon and oxygen is added as a crystallization auxiliary in (1).Type: GrantFiled: October 11, 2006Date of Patent: May 24, 2011Assignees: BASF SE, rubitec GmbHInventors: Ulrich Mueller, Roger Ruetz, Hermann Gies
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Publication number: 20080253953Abstract: The present invention relates to a process for the preparation of a silicate comprising at least silicon and oxygen, comprising (1) mixing of silicon dioxide and/or of a silicon dioxide precursor with an aqueous solution comprising at least one tetraalkylammonium compound comprising R1R2R3R4N+ and at least one base, wherein R1 and R2 are methyl and both R3 and R4 are n-propyl; (2) heating of the colloidal solution obtained according to (1) to a temperature in the range of from greater than the boiling point of the colloidal solution under the chosen pressure to 180° C. at atmospheric pressure to give a suspension comprising at least one silicate, wherein the silicate comprising at least silicon and oxygen is added as a crystallization auxiliary in (1).Type: ApplicationFiled: October 11, 2006Publication date: October 16, 2008Applicants: BASF SE, rubitec GmbHInventors: Ulrich Muller, Roger Ruetz, Hermann Gies
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Publication number: 20080000354Abstract: The present invention relates to a tectosilicate having an X-ray diffraction pattern in which at least the following reflections occur: Intensity (%) Diffraction angle 2?/° [Cu K(alpha 1)] 100 ?9.8-10.2 24-34 11.0-11.4 ?9-19 15.5-15.9 12-22 19.4-19.6 19-29 19.6-19.8 100% relating to the intensity of the maximum peak in the X-ray diffraction pattern.Type: ApplicationFiled: April 13, 2005Publication date: January 3, 2008Applicants: BASF Aktiengesellschaft, Rubitec GmbHInventors: Ulrich Muller, Gerald Lippert, James Brown, Hermann Gies, Bernd Marler, Nadine Stroter, Yingxia Wang