Patents Assigned to Rydberg Technologies Inc.
  • Patent number: 11774482
    Abstract: Methods and apparatus for sensing or measuring an electromagnetic field. The method entails excitation into a distribution of Rydberg states of atoms of a gas occupying a test volume coextensive with the electromagnetic field. Transmission along a path traversing the test volume of at least one probe beam of electromagnetic radiation is measured at one or more frequencies overlapping a spectral feature, and a physical characteristic of the electromagnetic field is derived on the basis of variation of the spectral feature. In various embodiments, the electromagnetic field may be place in interferometric relation with another electromagnetic field. Time-varying electric field amplitude, frequency, phase and noise spectral distribution may be measured, and thus AM and FM modulated fields, as well as magnetic fields of about 1 Tesla. The apparatus for measuring the electromagnetic field may be unilaterally coupled to a probe field and detector or array of detectors.
    Type: Grant
    Filed: June 13, 2022
    Date of Patent: October 3, 2023
    Assignee: Rydberg Technologies Inc.
    Inventors: David A. Anderson, Georg A. Raithel, Eric G. Paradis, Rachel E. Sapiro
  • Patent number: 11592469
    Abstract: A method for atom-based closed-loop control includes exciting atoms of a gas into one or more Rydberg states, applying one or more signal processing functions to the one or more Rydberg states, and regulating a characteristic of the applied one or more signal processing functions based on, at least in part, a response of the one or more Rydberg states to the one or more signal processing functions. A system for internal quantum-state-space interferometry includes an atomic receiver, an interferometric pathway, and a detector. The interferometer includes an atomic vapor with first atomic states and second atomic states. The interferometric pathway from RF phases between the first and second atomic states is closed by a quantum-state-space. The detector is configured to detect a readout of an interferometric signal. Embodiments include atom-based automatic level control, baseband processors, phase-locked loops, voltage transducers, raster RF imagers and waveform analyzers.
    Type: Grant
    Filed: May 28, 2021
    Date of Patent: February 28, 2023
    Assignee: Rydberg Technologies Inc.
    Inventors: David A. Anderson, Georg Raithel
  • Patent number: 11360135
    Abstract: Methods and apparatus for sensing or measuring an electromagnetic field. The method entails excitation into a distribution of Rydberg states of atoms of a gas occupying a test volume coextensive with the electromagnetic field. Transmission along a path traversing the test volume of at least one probe beam of electromagnetic radiation is measured at one or more frequencies overlapping a spectral feature, and a physical characteristic of the electromagnetic field is derived on the basis of variation of the spectral feature. In various embodiments, the electromagnetic field may be place in interferometric relation with another electromagnetic field. Time-varying electric field amplitude, frequency, phase and noise spectral distribution may be measured, and thus AM and FM modulated fields, as well as magnetic fields of about 1 Tesla. The apparatus for measuring the electromagnetic field may be unilaterally coupled to a probe field and detector or array of detectors.
    Type: Grant
    Filed: November 2, 2020
    Date of Patent: June 14, 2022
    Assignee: Rydberg Technologies Inc.
    Inventors: David A. Anderson, Georg A. Raithel, Eric G. Paradis, Rachel E. Sapiro
  • Patent number: 10823775
    Abstract: Methods and apparatus for sensing or measuring an electromagnetic field. The method entails excitation into a distribution of Rydberg states of atoms of a gas occupying a test volume coextensive with the electromagnetic field. Transmission along a path traversing the test volume of at least one probe beam of electromagnetic radiation is measured at one or more frequencies overlapping a spectral feature, and a physical characteristic of the electromagnetic field is derived on the basis of variation of the spectral feature. In various embodiments, the electromagnetic field may be place in interferometric relation with another electromagnetic field. Time-varying electric field amplitude, frequency, phase and noise spectral distribution may be measured, and thus AM and FM modulated fields, as well as magnetic fields of about 1 Tesla. The apparatus for measuring the electromagnetic field may be unilaterally coupled to a probe field and detector or array of detectors.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: November 3, 2020
    Assignee: Rydberg Technologies Inc.
    Inventors: David A. Anderson, Georg A. Raithel, Eric G. Paradis, Rachel E. Sapiro