Abstract: A cleaning system for cleaning a band circulating in a paper making machine; the system comprising: at least one detecting device configured to detect at least one parameter indicative of the cleaning conditions of the band on at least one portion of the band; at least one cleaning device provided with at least one nozzle to create a jet of a cleaning fluid; the nozzle being arranged so that the jet of cleaning fluid is directed towards the band; a control device configured to regulate the cleaning device on the basis of the at least one parameter indicative of the cleaning of the band.

Abstract: A monitoring system for monitoring the conditions of a band circulating in a paper-making machine, comprises a guide extending substantially along an axis; and a monitoring apparatus movable along the guide and comprising at least one measuring device configured to measure at least one parameter indicative of the conditions of the band; the apparatus is a self-propelled motorized apparatus, provided with a motor and at least one driving member operated by the motor and which engages at least one corresponding surface of the guide to move the apparatus along the guide.

Abstract: A monitoring system for monitoring the conditions of a band circulating in a paper making machine is provided with: a detecting device configured to detect at least one parameter indicative of the conditions of the band; and with a moving assembly configured to move the detecting device along a direction transversal to the circulating direction of the band and comprising a cable moving device.

Abstract: An apparatus for controlling the conditions of at least one band circulating in a paper making machine along a circulation direction is provided with at least one first detecting device configured to detect at least one first parameter indicative of the humidity of the band and positionable in a first position between a pressing station and a conditioning station of the paper making machine; at least one second detecting device configured to detect at least one second parameter indicative of the humidity of the band and positionable in a second position downstream of the conditioning station; and at least one processing unit configured to determine at least one datum indicative of the condition of the band on the basis of the first parameter indicative of the humidity and of the second parameter indicative of the humidity.

Abstract: The invention relates to a hand-held apparatus for controlling the condition of a circulating band in a papermaking machine; the apparatus comprises a hand-held body which carries: a moisture measuring device, equipped with at least one microwave sensor; a permeability measuring device, comprising at least one water delivery nozzle and a flowmeter associated with the nozzle; and a control unit connected to the measuring devices for processing signals coming therefrom; the body is equipped with at least one handle portion to be grasped by an operator for manually moving and maneuvering the apparatus.

Abstract: A device for measuring the thickness of a layer of material, the device including a reading head and control unit connected to the reading head. The reading head includes a microwave planar type sensor and an A/D converter connected to the microwave sensor and arranged in proximity of the microwave sensor.

Abstract: Described herein is a method for measuring, via a microwave sensor, the thickness of a layer of first material, said method envisaging: acquiring at least one frequency response of the layer of first material via a microwave sensor; setting the microwave sensor on a plurality of specimens of second materials for different temperature values in such a way as to obtain reference data; calibrating the microwave sensor as a function of the electrical conductivity of the first material using the reference data; measuring the temperature of the layer of first material via a temperature sensor; determining measurement parameters from the frequency response; and processing the reference data with the measurement parameters to obtain a measurement of the thickness of the layer of first material.