Abstract: Provided are method and device for testing product, computer device and readable storage medium, wherein in the first testing stage of testing cycle, for each processing machine, the total product number and the tested-product number of products processed by the processing machine are counted; the product testing rate of each processing machine is calculated; in the second testing stage, when machine with product testing rate lower than the preset threshold and machine with the product testing rate higher than the preset threshold appear, products in unprocessed products that meet the preset sampling rule are transferred to the processing machine whose product testing rate is lower than the preset threshold for being processed, and products that do not meet the preset sampling rule are transferred to the processing machine with the product testing rate higher than the preset threshold for being processed, until end of the testing cycle.

Abstract: A method and an apparatus for determining a product manufacturing program, a device and a storage medium are provided. According to an information identifier configured for describing target key information of the product manufacturing requirement of the target user, a first product manufacturing program with the same information identifier as the target key information is determined from a product manufacturing program library; an operating parameter of a product manufacturing device when manufacturing the target product is input into the first product manufacturing program to simulate manufacturing of the target product, to obtain a first product parameter of a first product obtained, and the first product parameter is compared with a standard product parameter to obtain a first comparison result; when the first product parameter is same as the standard product parameter, the first product manufacturing program is determined as a first target product manufacturing program.

Abstract: The present disclosure provides a method and a device for testing a wafer, an electronic device, and storage medium, wherein the method includes: obtaining plural test sheets; dividing the wafers to be tested in the plurality of test sheets according to individual test items in the plurality of test sheets, and determining the wafers to be tested corresponding to individual divided units; determining a test sequence of the test items to be performed on each wafer to be tested, based on a test sequence condition of the test items in individual test sheets and a test condition of a testing machine corresponding to individual divided units; and testing the wafer to be tested, according to the test sequence of the test items to be performed on any of the wafers to be tested.