Abstract: A method and apparatus for traffic safety are provided using vehicle driving-related information obtained on the basis of a transmission/reception beam pair of a road side unit (RSU) and a vehicle on-board unit (OBU), thereby reducing a probability that vehicle collisions occur where visual fields may be obscured. The method includes setting a path from a current location of the electronic device to a destination, and transmitting a message indicating an emergency situation to other devices located on the path while moving to the destination. The method further includes determining a transmission/reception beam pair of the electronic device and a road apparatus, using a reference signal received from the road apparatus, transmitting a signal including information for the transmission/reception beam pair to the road apparatus, and receiving, from the road apparatus, a message warning that the electronic device and another neighboring electronic device are approaching each other.

Abstract: Disclosed is a method of substituting for authentication of subscriber terminals of a mobile communication network for a third party site in a radio mobile communication system, the method including: obtaining traffic information for each subscriber terminal from the mobile communication network to which the subscriber terminals connect; receiving an authentication request for a first subscriber terminal from the third party site that has received a service request of the first subscriber terminal from the mobile communication network; and authenticating, if an IP address of the first subscriber terminal is one of IP addresses of the subscriber terminals contained in the traffic information, the first subscriber terminal using traffic information of the first subscriber terminal, and providing an authentication result to the third party site.

Abstract: A nonvolatile memory device is operated by programming sample data in the memory device for verification using verify voltage levels derived from an ideal verify voltage Vv associated with a particular temperature range, performing read verify operations on the sample data using the verify voltage Vv associated with the temperature range; and determining a temperature compensation parameter Nc based on results of the read verify operations.

Abstract: Provided is a multi-voltage generator for a flash memory device including a high voltage pumping unit configured to generate a high voltage in response to an enable signal, voltage regulators, each regulator coupled to the high voltage and a control voltage and configured to generate a pumping signal, and a selector configured to select one of the pumping signals as the enable signal.

Abstract: According to some embodiments, a method includes forming at least two contact plugs that penetrate an insulating layer to connect with a semiconductor substrate. The contact plugs have an upper surface and upper sidewalls that are higher than a top surface of the insulating layer. An etch stop covers the contact plugs and the insulating layer, and a molding layer is formed over the etch stop layer. The molding layer is etched to form a molding pattern having an opening. A bottom of the opening includes a central region that exposes the etch stop on the upper surface and a peripheral region that extends from the central region and the etch stop layer. The etch stop is etched to expose the upper surface. Storage electrodes are formed to contact the contact plugs. The molding pattern is removed to expose the storage electrodes. Other embodiments are described and claimed.

Abstract: A semiconductor device having many pins is tested using a test system having fewer pins. The test system includes a pin electronics (PE) card and a pattern memory. The PE card preferably includes a plurality of comparator and driver units to drive predetermined input signal pattern to be applied to an input pin of the semiconductor device and to compare data output from an output pin of the semiconductor device with a predetermined output signal pattern. Some or all of the pins of the semiconductor device may be divided into pin groups having K number of pins. The PE card also preferably includes a plurality of control units for electrically connecting each of the comparator and driver units to a selected pin in a selected pin group in response to a control signal.