Abstract: Present invention provides a spectrometer including a first unit spectral filter configured to absorb or reflect light in a part of a wavelength band of a light spectrum of an incident target, a second unit spectral filter configured to absorb or reflect light in a wavelength band different from the part of the wavelength band, a first light detector configured to detect a first light spectrum passing through the first unit spectral filter, a second light detector configured to detect a second light spectrum passing through the second unit spectral filter, and a processing unit configured to perform a function of restoring a light spectrum of the target incident from spectra of light detected from the first light detector and the second light detector.

Abstract: In a Converged IP Messaging (CPM) service, an arbitrary terminal generates a message based on a user input, and transmits the message to a CPM server. Upon receiving the message, the CPM server requests a presence server to provide presence information corresponding to a recipient of the message. The presence server searches for presence information corresponding to the recipient in response to the request of the CPM server, and transmits the searched presence information to the CPM server. Based on the transmitted presence information, the CPM server decides to perform interworking for the message, decides a type of a messaging service for interworking, and transmits the message to an Interworking Function (IWF) according to the decided type of the messaging service. The IWF receives the message, converts the message according to the decided messaging service, and transmits the converted message to the recipient.

Abstract: An airbag having a venting device defined by an upper part surrounding the venting opening (25) and a lower part (13) separated by a separating element (15), configuring a chamber (21) in which the lower part (13) has a closing element (31, 33, 35, 37) in its central part opposite the venting opening (25) and includes a plurality of openings (41, 43, 45, 47) to receive the gas from the bag, said closing element being able to totally or partially close the venting opening (25) when the inner pressure of the bag (23) exceeds predetermined limits (P2, P3).

Abstract: A method of and apparatus for varying a recording density of a data storage system. The method includes setting a range of a region whose recording density is to be changed, judging whether a region in which data read and write commands are to be executed is within the set range, and performing data read and write operations by allocating only one data among a plurality of continuous tracks as a data track if the region in which the data read and write commands are to be executed is within the set range.

Abstract: A method of forming a SOI type semiconductor device comprises forming a first trench in a SOI layer forming a portion of an isolation layer region between an element region and a ground region by etching the SOI layer of a SOI type substrate using an etch stop layer pattern as an etch mask, forming an impurity layer in or on a bottom surface of the first trench, forming a second trench exposing a buried oxide layer in the SOI layer in the remainder of the isolation layer region except the portion thereof between the element region and the ground region, and forming an isolation layer by depositing an insulation layer over the SOI substrate having the first and second trenches. The impurity layer can be formed by depositing a SiGe single crystal layer in the bottom surface of the first trench. Also, the impurity layer can be formed by implanting ions in the bottom surface of the first trench.

Abstract: According to various aspects and embodiments of this invention, a semiconductor device having many pins can effectively be tested using a test system having fewer pins. A semiconductor device test system and method are provided to effectively test a semiconductor device having many pins. The test system includes a pin electronics (PE) card and a pattern memory. The PE card preferably includes a plurality of comparator and driver units, wherein each comparator and driver unit can include a driver for driving a predetermined input signal pattern to be applied to an input pin of the semiconductor device and a comparator for comparing data output from an output pin of the semiconductor device with a predetermined output signal pattern. Some or all of the pins of the semiconductor device are divided into pin groups having K number of pins.