Abstract: An EDT apparatus 1 is disclosed, comprising a dielectric fluid return system for use with an EDT machine of the type in which the workpiece is not submersed in dielectric fluid. The return system comprises a first collector 19 for catching spills from a dielectric bath 9 associated with a set of electrodes 10 which apply electrical pulses to the workpiece through the dielectric fluid in the bath. Also, a separate, second collector 21 is positioned substantially beneath the workpiece and arranged both to receive fluid from the first collector 19 and to catch fluid that drips from the workpiece itself, the second collector being connected to a pump 13 which returns the fluid from the second collector to the dielectric bath.

Abstract: An apparatus and method detect defects in a metal surface. The apparatus is configured to move an eddy coil relative to an underlying metallic surface along a plurality of generally parallel and adjacent scan paths, and to receive from the eddy coil an oscillating signal induced at said coil as it is moved along each path. A representation of the received oscillating signal in relation to each one of a plurality of adjacent scan areas within each path is recorded, and a two-dimensional grid-like map showing the signal representations relative to each scan area is displayed. Defect location is facilitated by a further function of the apparatus and method, by which user input to an interface causes a light source to illuminate a selected part of the metallic surface.

Abstract: An apparatus and method for detecting defects in a metal surface is disclosed. The apparatus is configured to move an eddy coil relative to an underlying metallic surface along a plurality of generally parallel and adjacent scan paths, and to receive from the eddy coil an oscillating signal induced at said coil as it is moved along each path. A representation of the received oscillating signal in relation to each one of a plurality of adjacent scan areas within each path is recorded, and a two-dimensional grid-like map showing the signal representations relative to each scan area is displayed. Defect location is facilitated by a further function of the apparatus and method, by which user input to an interface causes a light source to illuminate a selected part of the metallic surface.

Abstract: A measuring system for measuring the strand condition of a continuous casting machine, the system comprising a plate member mounted on a caster chain (10) in use, the plate member (12) having an edge (14) that protrudes outwardly from one surface (13) of the caster chain (10); a pivotally mounted arm (16) capable of protruding outwardly from the opposing surface (17) of the caster chain (10); and means to determine the distance between the tip (18) of the arm (16) and the plate edge (14) at any given interval during use.

Abstract: A measuring system for measuring the strand condition of a continuous casting machine, the system comprising a plate member mounted on a caster chain (10) in use, the plate member (12) having an edge (14) that protrudes outwardly from one surface (13) of the caster chain (10); a pivotally mounted arm (16) capable of protruding outwardly from the opposing surface (17) of the caster chain (10); and means to determine the distance between the tip (18) of the arm (16) and the plate edge (14) at any given interval during use.