Abstract: The invention relates to a method for electromagnetically testing an object, a method in which electromagnetic radiation is directed by a probe in a predetermined main aiming direction toward a predetermined test point at which the object is located. The invention is characterized in that the probe and a stand for the object are moved relative to one another by a mechanical moving device according to a movement representative of a predetermined angular spread statistic relative to the main aiming direction, in order to generate, by means of the probe, electromagnetic radiation having said predetermined angular spread statistic relative to the main aiming direction.
Abstract: The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes, a structure for supporting the network of probes and a support for supporting the object being tested. According to the invention, the structure is closed in the three dimensions of space all around the support for the object being tested by at least one conductive wall forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers located in the intervals between the probes.
Type:
Grant
Filed:
October 7, 2011
Date of Patent:
February 23, 2016
Assignee:
Satimo Industries
Inventors:
Philippe Garreau, Luc Duchesne, Raphaël Laporte, Ludovic Durand
Abstract: The invention concerns a system for simulating electromagnetic environments, including a network of emitting and/or receiving probes to test at least one test antenna, channels for connecting the probes to a channel emulator, a signal emitting unit, a signal receiving unit, one of the units being connected to the emulator. The invention is characterized by a switching device having a first measurement position, in which the device connects the emulator respectively to at least one of the probes via the associated channel and connects the other unit to the test antenna, and a second position for calibrating the channels, in which the switching device connects the emulator to the other unit via the associated channel without passing through the network of probes.
Abstract: The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes (2), a structure (3) for supporting the network of probes (2) and a support (4) for supporting the object being tested. According to the invention, the structure (3) is closed in the three dimensions of space all around the support (4) for the object being tested by at least one conductive wall (31) forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers (5) located in the intervals between the probes (2).
Type:
Application
Filed:
October 7, 2011
Publication date:
August 15, 2013
Applicant:
SATIMO INDUSTRIES
Inventors:
Philippe Garreau, Luc Duchesne, Raphaël Laporte, Ludovic Durand
Abstract: The invention relates to a method for electromagnetic testing of an object, a method in which electromagnetic radiation is sent by a probe (2) in a determined principal aiming direction (D) towards a determined test point (40) where the object (OT) is located. The invention is defined in that the probe (2) and a support (104) for the object (OT) are moved relative to each other by a mechanical displacement device (60) according to a movement representative of a predetermined angular spread statistic relative to the principal aiming direction (D) to generate electromagnetic radiation having this predetermined angular spread statistic relative to the principal aiming direction (D) by the probe (2).
Abstract: The invention concerns a system for simulating electromagnetic environments, including a network of emitting and/or receiving probes to test at least one test antenna, channels for connecting the probes to a channel emulator, a signal emitting unit, a signal receiving unit, one of the units being connected to the emulator. The invention is characterized by a switching device having a first measurement position, in which the device connects the emulator respectively to at least one of the probes via the associated channel and connects the other unit to the test antenna, and a second position for calibrating the channels, in which the switching device connects the emulator to the other unit via the associated channel without passing through the network of probes.