Patents Assigned to SATIMO INDUSTRIES
  • Patent number: 9476925
    Abstract: The invention relates to a method for electromagnetically testing an object, a method in which electromagnetic radiation is directed by a probe in a predetermined main aiming direction toward a predetermined test point at which the object is located. The invention is characterized in that the probe and a stand for the object are moved relative to one another by a mechanical moving device according to a movement representative of a predetermined angular spread statistic relative to the main aiming direction, in order to generate, by means of the probe, electromagnetic radiation having said predetermined angular spread statistic relative to the main aiming direction.
    Type: Grant
    Filed: October 7, 2011
    Date of Patent: October 25, 2016
    Assignee: Satimo Industries
    Inventors: Luc Duchesne, Raphaël Laporte
  • Patent number: 9267967
    Abstract: The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes, a structure for supporting the network of probes and a support for supporting the object being tested. According to the invention, the structure is closed in the three dimensions of space all around the support for the object being tested by at least one conductive wall forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers located in the intervals between the probes.
    Type: Grant
    Filed: October 7, 2011
    Date of Patent: February 23, 2016
    Assignee: Satimo Industries
    Inventors: Philippe Garreau, Luc Duchesne, Raphaël Laporte, Ludovic Durand
  • Patent number: 9188618
    Abstract: The invention concerns a system for simulating electromagnetic environments, including a network of emitting and/or receiving probes to test at least one test antenna, channels for connecting the probes to a channel emulator, a signal emitting unit, a signal receiving unit, one of the units being connected to the emulator. The invention is characterized by a switching device having a first measurement position, in which the device connects the emulator respectively to at least one of the probes via the associated channel and connects the other unit to the test antenna, and a second position for calibrating the channels, in which the switching device connects the emulator to the other unit via the associated channel without passing through the network of probes.
    Type: Grant
    Filed: April 26, 2011
    Date of Patent: November 17, 2015
    Assignee: Satimo Industries
    Inventor: Nicolas Gross
  • Publication number: 20130207680
    Abstract: The invention relates to a device for the electromagnetic testing of an object, comprising a network of electromagnetic probes (2), a structure (3) for supporting the network of probes (2) and a support (4) for supporting the object being tested. According to the invention, the structure (3) is closed in the three dimensions of space all around the support (4) for the object being tested by at least one conductive wall (31) forming a Faraday cage which is fitted on its inner side by anechoic electromagnetic absorbers (5) located in the intervals between the probes (2).
    Type: Application
    Filed: October 7, 2011
    Publication date: August 15, 2013
    Applicant: SATIMO INDUSTRIES
    Inventors: Philippe Garreau, Luc Duchesne, Raphaël Laporte, Ludovic Durand
  • Publication number: 20130187815
    Abstract: The invention relates to a method for electromagnetic testing of an object, a method in which electromagnetic radiation is sent by a probe (2) in a determined principal aiming direction (D) towards a determined test point (40) where the object (OT) is located. The invention is defined in that the probe (2) and a support (104) for the object (OT) are moved relative to each other by a mechanical displacement device (60) according to a movement representative of a predetermined angular spread statistic relative to the principal aiming direction (D) to generate electromagnetic radiation having this predetermined angular spread statistic relative to the principal aiming direction (D) by the probe (2).
    Type: Application
    Filed: October 7, 2011
    Publication date: July 25, 2013
    Applicant: SATIMO INDUSTRIES
    Inventors: Luc Duchesne, Raphaël Laporte
  • Publication number: 20130099985
    Abstract: The invention concerns a system for simulating electromagnetic environments, including a network of emitting and/or receiving probes to test at least one test antenna, channels for connecting the probes to a channel emulator, a signal emitting unit, a signal receiving unit, one of the units being connected to the emulator. The invention is characterized by a switching device having a first measurement position, in which the device connects the emulator respectively to at least one of the probes via the associated channel and connects the other unit to the test antenna, and a second position for calibrating the channels, in which the switching device connects the emulator to the other unit via the associated channel without passing through the network of probes.
    Type: Application
    Filed: April 26, 2011
    Publication date: April 25, 2013
    Applicant: SATIMO INDUSTRIES
    Inventor: Nicolas Gross