Patents Assigned to Scaneva Ltd.
  • Patent number: 8797623
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Grant
    Filed: April 4, 2013
    Date of Patent: August 5, 2014
    Assignee: Scaneva Ltd.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Publication number: 20130242363
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Application
    Filed: April 4, 2013
    Publication date: September 19, 2013
    Applicant: SCANEVA LTD.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin
  • Patent number: 8437063
    Abstract: A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
    Type: Grant
    Filed: May 4, 2011
    Date of Patent: May 7, 2013
    Assignee: Scaneva Ltd.
    Inventors: Yizhar Weiss, Mordekhai Velger, Sivan Natan-Knaz, Raviv Erlich, Alexander Sromin