Patents Assigned to Scannex, Inc.
  • Method and apparatus for non-destructive detection of hidden flaws
    Patent number: 6157699
    Abstract: X- or .gamma.-radiation is utilized during non-destructive examination of a sample, to detect hidden flaws in a test sample by generating a number referred to as a single figure-of-merit. The figure-of-merit is obtained by comparing the set of responses obtained from radiation emanating from a standard sample with a set of responses obtained from radiation emanating from a test sample. The resulting figure-of-merit is then compared with a reference value as an indicator of the presence of a flaw.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: December 5, 2000
    Assignee: Scannex, Inc.
    Inventor: William L. Dunn