Abstract: A wireless assembly for communicating electrical signals between test equipment and a unit under test using contact probes having at a first end a head electrically connected to a test point on the unit under test and a contact at a second end. The wireless assembly includes a translator board electrically connected to the test equipment; a probe plate in a spaced relationship with the translator board, at least one probe socket having a compression ring and a contact, the probe socket being fitted through holes in the probe plate; and a contact receptacle provided on and electrically connected to the translator board. The contact receptacle provides wireless electrical interconnection between the probe and the translator board by exerting only a circumferential force on the probe, generally without exerting a static force on the translator board. The contact receptacle is configured to eliminate transient forces caused by flexure of the probe plate from being transmitted to the translator board.