Patents Assigned to Schilmass Co. L.L.C.
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Patent number: 9105850Abstract: A system is provided for the manufacture of carbon based electrical components including, an ultraviolet light source; a substrate receiving unit whereby a substrate bearing a first layer of carbon based semiconductor is received and disposed beneath the ultraviolet light source; a mask disposed between the ultraviolet light source and the carbon based semiconductor layer; a doping agent precursor source; and environmental chemical controls, configured such that light from the ultraviolet light source irradiates a doping agent precursor and the first carbon layer.Type: GrantFiled: December 12, 2011Date of Patent: August 11, 2015Assignee: SCHILMASS CO. L.L.C.Inventors: Daniel N. Carothers, Rick L. Thompson
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Patent number: 8669812Abstract: A high power amplifier architecture is disclosure. One example configuration includes a first plurality of distributed amplification stages operatively coupled in a first string. A conductive trace associated with the first string provides a stepped structure, such that the associated inductance successively decreases from input to output of the first string. A second plurality of distributed amplification stages is operatively coupled in a second string, and a conductive trace associated therewith provides a stepped structure, such that the associated inductance successively decreases from input to output of the second string. In one example case, each of the first and second strings comprises gallium nitride transistor amplification stages formed on silicon carbide. The module may further include a heat spreader material that thermally and electrically couples to the amplification stages. The conductive trace associated with one string can be shared with another string.Type: GrantFiled: January 28, 2011Date of Patent: March 11, 2014Assignee: Schilmass Co., L.L.C.Inventors: Robert Actis, Robert J. Lender, Jr., Steve M. Rajkowski, Kanin Chu, Blair E. Coburn
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Patent number: 8576009Abstract: A broadband high power amplifier architecture is disclosed. One example configuration includes a first plurality of distributed amplification cells connected in a first string, wherein a conductive trace operatively coupling outputs of the first string cells is a stepped structure, such that the associated inductance successively decreases from a first cell to a last cell of the first string. The amplifier further includes a second plurality of distributed amplification cells connected in a second string, wherein a conductive trace operatively coupling outputs of the second string cells is a stepped structure, such that the associated inductance successively decreases from a first cell to a last cell of the second string. A combiner combines output signals of the first and second strings. Additional strings and/or stages can be provided, and the degree of combining will depend, for example, on factors such as the application and desired output power.Type: GrantFiled: December 12, 2011Date of Patent: November 5, 2013Assignee: Schilmass Co. L.L.C.Inventors: Robert J. Lender, Jr., Robert Actis
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Patent number: 8389370Abstract: An enhanced shallow trench isolation method for fabricating radiation tolerant integrated circuit devices is disclosed. A layer of pad oxide is first deposited on a semiconductor substrate. A layer of pad nitride is then deposited on the pad oxide layer. A trench is defined within the semiconductor substrate by selectively etching the pad nitride layer, the pad oxide layer, and the semiconductor substrate. Boron ions are then implanted into both the bottom and along the sidewalls of the trench. Subsequently, a trench plug is formed within the trench by depositing an insulating material into the trench and by removing an excess portion of the insulating material. A p-well is implanted to a depth just below the depth of the bottom of the trench. This helps to keep the threshold voltage of the IC device below the trench at a high level, and thereby keep post-radiation leakage low. Then, an electrically neutral species is implanted into the wafer.Type: GrantFiled: November 25, 2002Date of Patent: March 5, 2013Assignee: Schilmass Co. L.L.C.Inventors: Nadim Haddad, Frederick Brady, Jonathon Maimon