Patents Assigned to Schmitt Measurement Systems, Inc.
  • Patent number: 8104341
    Abstract: An ultrasonic liquid level monitoring system includes an ultrasonic transducer unit that is externally mountable to a tank. An ultrasonic emitter may generate an ultrasonic beam and receive an echo of the ultrasonic beam off a liquid surface inside a tank. An acoustic lens is coupled to the ultrasonic emitter to shape the ultrasonic beam to compensate for lensing effects of the tank wall. An acoustic coupler may be disposed between the acoustic lens and the tank wall to improve the acoustic coupling between the ultrasonic emitter and the tank wall. The system determines a time-of-flight between generating the ultrasonic beam and receiving the echo. Using the time-of-flight and geometry of a tank, the system may calculate the liquid volume inside the tank. The time-of-flight may be transmitted via a satellite data link or a local data link. The local data link may further be used to configure and maintain the system.
    Type: Grant
    Filed: March 25, 2009
    Date of Patent: January 31, 2012
    Assignee: Schmitt Measurement Systems, Inc.
    Inventors: Peter J. Lagergren, Christian N. Staats, Kenneth M. Wegrzyn, Kelvin L. Woltring, Wayne A. Case
  • Patent number: 7905143
    Abstract: An ultrasonic liquid level monitoring system includes an ultrasonic transducer unit that is mountable to a tank. The unit has an emitter to generate an ultrasonic beam passing through the wall of the tank. The emitter further receives an echo of the ultrasonic beam off a liquid surface. An acoustic lens is disposed between the emitter and the tank wall to receive and shape the ultrasonic beam to compensate for lensing effects of the tank wall.
    Type: Grant
    Filed: July 23, 2007
    Date of Patent: March 15, 2011
    Assignee: Schmitt Measurement Systems, Inc.
    Inventor: Peter Lagergren
  • Patent number: 6781703
    Abstract: A non-contact gauging system and method profiles a workpiece to accurately determine cylindrical surface profiles. The system includes a sensor head for performing reflected light measurements. The sensor head couples to a sensor arm that is movable in longitudinal, lateral, and transverse directions. A computer controls operation of the sensor head and arm to perform various proximity measurements of the workpiece. Proximity measurements are made along at least three parallel, lateral tracks that extend along a longitudinal length of the workpiece surface. The sensor head takes proximity measurements as it is moved continuously along each lateral track. The computer determines the diameters of the workpiece along the longitudinal length based on the proximity measurements and generates a profile.
    Type: Grant
    Filed: January 11, 2002
    Date of Patent: August 24, 2004
    Assignee: Schmitt Measurement Systems, Inc.
    Inventor: Mark E. Southwood
  • Patent number: 6700657
    Abstract: A method for characterizing a surface are disclosed. The system includes a light source optic which direct a beam of light toward the surface. Scattered light and a spectacular beam are reflected from the surface. A collector collects the scattered light and directs the scattered light to a detector. The detector measures the intensity of the scattered light. A shutter is advanced into position to intersect the scattered light and to block a segment not having substantially any anisotropic light scatter. The shutter further passes another segment having substantially all of the anisotropic light scatter. The detector measures the intensity of the passed segment. A roughness ratio indicative of the anisotropic roughness to the isotropic roughness is produced by evaluating the total intensity of the scattered light and the intensity of the passed segment.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: March 2, 2004
    Assignee: Schmitt Measurement Systems, Inc.
    Inventor: Mark E. Southwood
  • Patent number: 6624899
    Abstract: The detector elements are larger than an image of the spot on the array would be, but an image is not formed on the array. Instead, the beam shaping element enlarges the size of the area of illumination on the array slightly, and mixes, or homogenizes, the light. This destroys the image and the intensity variations originating at the spot on the surface that would be contained in the image. The enlargement of the area of illumination together with the homogenization allow the position of the beam on the array to be determined to a resolution of about {fraction (1/10)}th of the width of a detector element. This position is then converted to an absolute distance output which may be read by digital or analog means.
    Type: Grant
    Filed: June 29, 2000
    Date of Patent: September 23, 2003
    Assignee: Schmitt Measurement Systems, Inc.
    Inventor: R. Robert Clark
  • Patent number: 6606922
    Abstract: The present invention provides an enhanced system and method for compensating for load imbalances of rotating members. An imbalance compensator may have a balancing ring wirelessly controlled by a ring controller. The balancing ring may have a housing containing a plurality of actuators configured to exert force against a compensation ring within the housing. The actuators may move the compensation ring with respect to the axis of rotation of the shaft in a direction substantially opposite the direction of the imbalance. The actuators may directly contact the compensation ring, or may exert the force through the use of mechanical transfer devices that provide a selected mechanical advantage. Alternatively, a chamber containing a magnetic fluid may be used to provide a counterbalancing mass. Particles within the magnetic fluid maybe concentrated opposite the imbalance direction through the use of electromagnets or permanent magnets mounted on movable carts.
    Type: Grant
    Filed: April 30, 2001
    Date of Patent: August 19, 2003
    Assignee: Schmitt Measurement Systems, Inc.
    Inventors: Wayne A. Case, Laurence B. Penswick
  • Patent number: 6078391
    Abstract: A system and method for characterizing a surface are disclosed. The system includes a light source and source optics which direct a beam of light toward the surface. A first optical integrating device is positioned and configured to receive a first portion of the scattered light and a second optical integrating device is positioned and configured to receive a second portion of the scattered light. The second optical integrating device reflects the second portion of the scattered light through a segmenting optic. The segmenting optic is configured to segment the second portion of the scattered light to thereby isolate the anisotropic roughness amplitude to one or more segments. A roughness ratio indicative of the anisotropic roughness is produced by comparing the roughness amplitudes of the segments.
    Type: Grant
    Filed: November 17, 1998
    Date of Patent: June 20, 2000
    Assignee: Schmitt Measurement Systems, Inc.
    Inventor: Tod F. Schiff
  • Patent number: 6062948
    Abstract: A gauging apparatus for use with a grinding machine performs dimensional measurements during machining of a workpiece. The gauging apparatus has a sensor head with a single sensor for performing proximity measurements of the workpiece. The sensor head further has vents adjacent to the sensor to vent air to clear working fluids and debris from between the sensor and the surface of the workpiece. A sensor head arm moves the sensor head in radial and tangential directions relative to the workpiece. A computer communicates with the sensor and the sensor head arm to determine, during the machining process, the relative position of the sensor head to the workpiece, the proximity of the sensor to the workpiece, the position of the workpiece, and the dimensions of the workpiece. The gauging apparatus is capable of performing measurements of the workpiece for initial positioning and for precision dimensional measurements.
    Type: Grant
    Filed: August 25, 1998
    Date of Patent: May 16, 2000
    Assignee: Schmitt Measurement Systems, Inc.
    Inventors: Tod F. Schiff, Mark E. Southwood, Michael J. Smith, Michael J. Harms
  • Patent number: 6023337
    Abstract: A target device for use in aligning a target station to a reference line-of-sight established by a laser alignment beam is mountably secured to the target station. The target device includes a tooling tube and a beam splitter for reflecting a portion of the alignment beam to a focusing objective. The focusing objective transmits the portion of the alignment beam to a position sensing detector for alignment measurement. The target device is designed to pivot about a target mount center reference point located in the tooling tube. The focusing objective and the beam splitter focus the image of the position sensing detector at the target mount center to produce a virtual image of the position sensing detector at the target mount center. By taking the alignment measurement at the target mount center, inaccurate measurements created by misalignment of the tooling tube with respect to the alignment beam are eliminated.
    Type: Grant
    Filed: September 26, 1997
    Date of Patent: February 8, 2000
    Assignee: Schmitt Measurement Systems, Inc.
    Inventor: Tod F. Schiff
  • Patent number: 5661556
    Abstract: A system and method for characterizing a surface are disclosed. The system includes a light source and source optics which direct a beam of light toward the surface. A first optical integrating device is positioned and configured to receive a first portion of the scattered light which corresponds to a first range of spatial frequencies. A second optical integrating device is positioned and configured to receive a second portion of the scattered light corresponding to a second range of spatial frequencies. In one embodiment, an integrating sphere is employed as the first optical integrating device. The sphere includes a sampling aperture which is surrounded by a light absorption region on the interior of the sphere. Total integrated scatter data is generated for each range of spatial frequencies and is used to approximate the spectral scatter function of the surface. RMS roughness is then approximated for any range of spatial frequencies.
    Type: Grant
    Filed: March 20, 1996
    Date of Patent: August 26, 1997
    Assignee: Schmitt Measurement Systems, Inc.
    Inventors: Tod F. Schiff, Marvin L. Bernt
  • Patent number: 5625451
    Abstract: A system and method for characterizing a surface are disclosed. The system includes a light source and source optics which direct a beam of light toward the surface. A first optical integrating device is positioned and configured to receive a first portion of the scattered light which corresponds to a first range of spatial frequencies. A second optical integrating device is positioned and configured to receive a second portion of the scattered light corresponding to a second range of spatial frequencies. In one embodiment, an integrating sphere is employed as the first optical integrating device. The sphere includes a sampling aperture which is surrounded by a light absorption region on the interior of the sphere. Total integrated scatter data is generated for each range of spatial frequencies and is used to approximate the spectral scatter function of the surface. RMS roughness is then approximated for any range of spatial frequencies.
    Type: Grant
    Filed: November 27, 1995
    Date of Patent: April 29, 1997
    Assignee: Schmitt Measurement Systems, Inc.
    Inventors: Tod F. Schiff, Marvin L. Bernt